KEYWORDS: Nanoparticles, Thin films, Near field optics, Microscopy, Interfaces, Super resolution, Dielectrics, Photonic nanostructures, Optical microscopy, Near field
The lateral and vertical resolution in conventional optical microscopy is restricted by fundamental diffraction limits. One direction towards super-resolution optical microscopy is the use of photonic nanojets (PNJs) for sample illumination. Here, the aim is to exploit the high spatial localization of PNJs to allow measurements of sub-classical particles and features in spite of their small size compared to the operating wavelength. The applications of super-resolution methods include fluorescence and Raman microscopy, scatterometric measurements, and optical imaging. As a step towards PNJ scanning microscopy, we here apply our recently proposed method for fast and precise steering of PNJs over a large dynamical range in the near field. In a proof-of-concept computation, we use the steerable optical probe to extract information on structures beyond the classical lateral and vertical resolution limits.
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