Prof. Klaus Sokolowski-Tinten Profile

Prof. Klaus Sokolowski-Tinten

at Univ of Duisburg-Essen

SPIE Involvement:

Author

Proceedings Article | 20 June 2024 Presentation

Advances in ultrafast laser manufacturing: nanostructures, thin films, and scaling perspectives

Jörn Bonse, Jörg Krüger, Camilo Florian, Klaus Sokolowski-Tinten, Stephan Gräf

Proceedings Volume PC13005, PC130050L (2024) https://doi.org/10.1117/12.3017420

KEYWORDS: Ultrafast lasers, Thin films, Thin film manufacturing, Manufacturing, Laser nanostructuring, Ultrafast phenomena, Laser processing, Pulsed laser operation, Laser applications, Materials processing

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Proceedings Article | 8 October 2014 Paper

Silicon single crystal as back-reflector for high-intensity hard x-rays

Tom Pardini, Sébastien Boutet, Joseph Bradley, Tilo Doeppner, Luke Fletcher, Dennis Gardner, Randy Hill, Mark Hunter, Jacek Krzywinski, Marc Messerschmidt, Arthur Pak, Florian Quirin, Klaus Sokolowski-Tinten, Garth Williams, Stefan Hau-Riege

Proceedings Volume 9210, 92100D (2014) https://doi.org/10.1117/12.2061087

KEYWORDS: Silicon, Crystals, X-rays, Hard x-rays, Liquid crystal lasers, Diodes, Prototyping, Mirrors, Semiconducting wafers, Laser crystals

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Proceedings Article | 18 May 2009 Paper

Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser

J. Cihelka, L. Juha, J. Chalupský, F. Rosmej, O. Renner, K. Saksl, V. Hájková, L. Vyšin, E. Galtier, R. Schott, A. Khorsand, D. Riley, T. Dzelzainis, A. Nelson, R. Lee, P. Heimann, B. Nagler, S. Vinko, J. Wark, T. Whitcher, S. Toleikis, T. Tschentscher, R. Faustlin, H. Wabnitz, S. Bajt, H. Chapman, J. Krzywinski, R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, S. Hau-Riege, R. London, J. Kuba, N. Stojanovic, K. Sokolowski-Tinten, A. Gleeson, M. Störmer, J. Andreasson, J. Hajdu, N. Timneanu

Proceedings Volume 7361, 73610P (2009) https://doi.org/10.1117/12.822766

KEYWORDS: Aluminum, Plasma, Silicon, Ions, Free electron lasers, Copper, Chemical species, Spectroscopy, Mirrors, Emission spectroscopy

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Proceedings Article | 12 May 2008 Paper

Femtosecond x-ray diffuse scattering measurements of semiconductor ablation dynamics

A. Lindenberg, S. Engemann, K. Gaffney, K. Sokolowski-Tinten, J. Larsson, D. Reis, P. Lorazo, J. Hastings

Proceedings Volume 7005, 700504 (2008) https://doi.org/10.1117/12.784094

KEYWORDS: Scattering, Liquids, X-rays, Laser scattering, Picosecond phenomena, Semiconductors, Femtosecond phenomena, Scatter measurement, Crystals, Optical spheres

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Proceedings Article | 30 August 2005 Paper

Ultrafast x-ray studies of structural dynamics at SLAC

K. Gaffney, A. Lindenberg, J. Larsson, K. Sokolowski-Tinten, C. Blome, O. Synnergren, J. Sheppard, D. Reis, J. Hastings

Proceedings Volume 5917, 59170D (2005) https://doi.org/10.1117/12.621679

KEYWORDS: X-rays, Crystals, Ultrafast phenomena, X-ray diffraction, Laser crystals, Structural dynamics, X-ray lasers, X-ray sources, Diffusion, Stanford Linear Collider

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Proceedings Article | 20 September 2004 Paper

Ionization mechanisms in dielectrics irradiated by femtosecond laser pulses (Poster Award Paper)

Vasily Temnov, Klaus Sokolowski-Tinten, Ping Zhou, Barbel Rethfeld, Vitaly Gruzdev, Abd-Allah El-Khamawy, Dietrich von der Linde

Proceedings Volume 5448, (2004) https://doi.org/10.1117/12.547145

KEYWORDS: Phase shifts, Ionization, Interferometry, Silica, Ultrafast imaging, Dielectrics, Femtosecond phenomena, Absorption, Refractive index, Modulation

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Proceedings Article | 18 November 2003 Paper

Excitation – melting – ablation: theoretical investigations of key processes during ultrashort pulsed laser machining

Baerbel Rethfeld, Klaus Sokolowski-Tinten, Dietrich von der Linde

Proceedings Volume 5063, (2003) https://doi.org/10.1117/12.540606

KEYWORDS: Laser ablation, Ionization, Femtosecond phenomena, Absorption, Picosecond phenomena, Pulsed laser operation, Solids, Ultrafast phenomena, Phonons, Dielectrics

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Proceedings Article | 13 September 2002 Paper

Microscopic characterization of ablation craters produced by femtosecond laser pulses

Vassili Temnov, Klaus Sokolowski-Tinten, Nikola Stojanovic, Sergei Kudryashov, Dietrich von der Linde, Boris Kogan, Andreas Schlarb, Bastian Weyers, Rolf Moeller, Joerg Seekamp, Clivia Sotomayor-Torres

Proceedings Volume 4760, (2002) https://doi.org/10.1117/12.482062

KEYWORDS: Laser ablation, Scanning electron microscopy, Gallium arsenide, Femtosecond phenomena, Atomic force microscopy, Silicon, Ultrafast phenomena, Laser damage threshold, Semiconductors, Solids

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Proceedings Article | 13 September 2002 Paper

Dynamics of ultrashort pulse-laser ablation: equation-of-state considerations

Baerbel Rethfeld, Vassili Temnov, Klaus Sokolowski-Tinten, Sergei Anisimov, Dietrich von der Linde

Proceedings Volume 4760, (2002) https://doi.org/10.1117/12.482055

KEYWORDS: Laser ablation, Microscopy, Aluminum, Femtosecond phenomena, Pulsed laser operation, Solids, Ultrafast phenomena, Spatial resolution, Interfaces, Gold

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Proceedings Article | 29 May 2002 Paper

Peculiarities of subpicosecond pulse interaction with bulk dielectric samples

T. Smirnova, Olga Fedotova, Baerbel Rethfeld, O. Khasanov, Klaus Sokolowski-Tinten, Dietrich von der Linde

Proceedings Volume 4748, (2002) https://doi.org/10.1117/12.468947

KEYWORDS: Plasma, Dielectrics, Refractive index, Absorption, Diffraction, Femtosecond phenomena, Dispersion, Ionization, Solids, Polarization

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Proceedings Article | 26 June 2001 Paper

Ablation dynamics of solids heated by femtosecond laser pulses

Baerbel Rethfeld, Klaus Sokolowski-Tinten, V. Temnov, Sergei Kudryashov, Joerg Bialkowski, Andrea Cavalleri, Dietrich von der Linde

Proceedings Volume 4423, (2001) https://doi.org/10.1117/12.431221

KEYWORDS: Laser ablation, Femtosecond phenomena, Aluminum, Microscopy, Solids, Silicon, Reflectivity, Pulsed laser operation, Ultrafast phenomena, Gold

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Proceedings Article | 21 October 1999 Paper

Ultrafast movies of atomic motion with femtosecond laser-based x rays

Craig Siders, Andrea Cavalleri, Klaus Sokolowski-Tinten, Ting Guo, Csaba Toth, Ralph Jimenez, Christoph Rose-Petruck, Martin Kammler, Michael Horn-von-Hoegen, Dietrich von der Linde, Kent Wilson, Christopher Barty

Proceedings Volume 3776, (1999) https://doi.org/10.1117/12.366680

KEYWORDS: Ultrafast phenomena, X-rays, Crystals, X-ray diffraction, Picosecond phenomena, Silicon, Germanium, Diffraction, Femtosecond phenomena, Gallium arsenide

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Proceedings Article | 15 March 1999 Paper

Physical mechanisms of short-pulse laser ablation

Dietrich von der Linde, Klaus Sokolowski-Tinten

Proceedings Volume 3734, (1999) https://doi.org/10.1117/12.342334

KEYWORDS: Laser ablation, Liquids, Silicon, Interfaces, Metals, Optical properties, Solids, Semiconductors, Pulsed laser operation, Picosecond phenomena

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Proceedings Article | 14 September 1998 Paper

Dynamics of femtosecond-laser-induced ablation from solid surfaces

Klaus Sokolowski-Tinten, Joerg Bialkowski, Andrea Cavalleri, Martin Boing, Harald Schueler, Dietrich von der Linde

Proceedings Volume 3343, (1998) https://doi.org/10.1117/12.321593

KEYWORDS: Laser ablation, Reflectivity, Plasma, Picosecond phenomena, Solids, Liquids, Silicon, Femtosecond phenomena, Microscopy, Photomicroscopy

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Proceedings Article | 14 September 1998 Paper

Time-of-flight mass spectroscopy of femtosecond laser ablation of solid surfaces

Andrea Cavalleri, Klaus Sokolowski-Tinten, Joerg Bialkowski, Dietrich von der Linde

Proceedings Volume 3343, (1998) https://doi.org/10.1117/12.321541

KEYWORDS: Laser ablation, Particles, Gallium arsenide, Temperature metrology, Gallium, Silicon, Femtosecond phenomena, Liquids, Solids, Semiconductors

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Showing 5 of 15 publications

Conference Committee Involvement (13)

High-Power Laser Ablation VIII

26 February 2024 | Santa Fe, New Mexico, United States

Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XXVI

6 March 2021 | Online Only, California, United States

Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XXV

3 February 2020 | San Francisco, California, United States

Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XXIV

4 February 2019 | San Francisco, California, United States

Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XXIII

29 January 2018 | San Francisco, California, United States

Showing 5 of 13 Conference Committees

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