Dr. Laurent Rubaldo
Senior Scientist at Lynred
SPIE Involvement:
Conference Program Committee | Author
Area of Expertise:
Optoelectronic , Electrical characterization , Electro-optical characterization , Semiconductor Physics , IR Photodetectors , Simulation
Profile Summary

Laurent Rubaldo was born in France, in1975. He received the Ph.D. degree in Physics from the University Joseph Fourier of Grenoble in 2001. He did his Ph.D. at the High Magnetic Field Laboratory of CNRS Grenoble in collaboration with the Institute of Science and Technology of the Manchester University. He studied deep levels in silicon, silicon alloys and III-V materials by Laplace DLTS, combining magnetic field and uniaxial stress to investigate the electronic and structural properties of defects.
He joined STMicroelectronics (Crolles France) in 2001 first as reliability Engineer, to study and modelize new hot carrier mechanisms for submicron CMOS transistors and in 2003 he joined the Front End Material R&D group to develop ultra-doped epitaxial Si and Si alloys by MOCVD. In 2007, he joined the Sofradir Group in the R&D Department, as a Semiconductor Characterization Expert, to work on electro-optical characterization and performances optimization of cooled IR Photodetectors.
Publications (47)

Proceedings Article | 10 June 2024 Presentation
Olivier Gravrand, Clément Lobre, Cecile Grezes, Titouan LeGoff, Diane Sam-Giao, Florent Rochette, Nicolas Baier, Laurent Rubaldo
Proceedings Volume 13046, 130460V (2024) https://doi.org/10.1117/12.3014111
KEYWORDS: Temperature metrology, Staring arrays, Mid-IR, Fabrication, Dark current

Proceedings Article | 7 June 2024 Presentation + Paper
Proceedings Volume 13046, 1304614 (2024) https://doi.org/10.1117/12.3014159
KEYWORDS: Staring arrays, Modulation transfer functions, Mid-IR, Black bodies, Readout integrated circuits, Quantum noise, Image quality, Nonuniformity corrections, Infrared radiation

Proceedings Article | 7 June 2024 Presentation + Paper
Laurent Rubaldo, Nicolas Morisset, Alexandre Brunner, Cécile Grezes, Nicolas Péré-Laperne, Gulnar Dagher, Alexandra Blay, Alexandre Kerlain, Clement Lobre, Olivier Gravrand, Pierre Jenouvrier, David Billon-Lanfrey
Proceedings Volume 13046, 130460I (2024) https://doi.org/10.1117/12.3013662
KEYWORDS: Modulation transfer functions, Medium wave, Staring arrays, Readout integrated circuits, Nonuniformity corrections, Diodes, Reproducibility, Quantum efficiency, Fluctuations and noise

Proceedings Article | 7 June 2024 Presentation + Paper
G. Jobert, N. Vannier, S. Pelletier, R. Delubac, X. Brenière, N. Péré-Laperne, L. Rubaldo
Proceedings Volume 13046, 1304609 (2024) https://doi.org/10.1117/12.3014161
KEYWORDS: Short wave infrared radiation, Aerosols, Visibility, Cameras, Atmospheric particles, Modulation transfer functions, Sensors, Light scattering, Indium gallium arsenide, Visible radiation

Proceedings Article | 13 June 2023 Presentation + Paper
S. Bustillos Vasco, N. Baier, C. Lobre, O. Gravrand, L. Rubaldo
Proceedings Volume 12534, 1253412 (2023) https://doi.org/10.1117/12.2663758
KEYWORDS: Modulation transfer functions, Diodes, Mercury cadmium telluride, Monte Carlo methods, Diffusion, Point spread functions, Photons, Staring arrays, Electron beams, Scanning electron microscopy, Infrared detectors, Pixel resolution

Showing 5 of 47 publications
Conference Committee Involvement (8)
Infrared Technology and Applications LI
13 April 2025 | Orlando, Florida, United States
Infrared Technology and Applications L
21 April 2024 | National Harbor, Maryland, United States
Infrared Technology and Applications XLIX
30 April 2023 | Orlando, Florida, United States
Infrared Technology and Applications XLVIII
3 April 2022 | Orlando, Florida, United States
Infrared Technology and Applications XLVII
12 April 2021 | Online Only, Florida, United States
Showing 5 of 8 Conference Committees
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