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Laura Cristina Diaz Porta
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Publications (1)
Proceedings Article | 24 May 2006 Paper
Internal defect localization in 980 nm ridge waveguide lasers
L. Díaz, H. Eichler, K. Weich, A. Klehr, U. Zeimer
Proceedings Volume 6193, 61930G (2006) https://doi.org/10.1117/12.662330
KEYWORDS: Laser induced damage, Semiconductor lasers, Fourier transforms, Optical amplifiers, Waveguide lasers, Laser damage threshold, Modulation, Electroluminescence, Waveguides, High power lasers
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