Mr. Laurentiu Rusen Profile

Laurentiu Rusen

Scientific Researcher III at INFLPR

SPIE Involvement:

Author

Publications (9)

Proceedings Article | 23 November 2015 Paper

Analysis of cumulative versus ISO-recommended calculation of damage probability using a database of real S-on-1 tests

Alexandru Zorila, Aurel Stratan, Ioana Dumitrache, Laurentiu Rusen, George Nemes

Proceedings Volume 9632, 96321H (2015) https://doi.org/10.1117/12.2194303

KEYWORDS: Laser energy, Probability theory, Standards development, Databases, Laser induced damage, Laser damage threshold, Error analysis, Laser development, Q switched lasers, Optics manufacturing, Manufacturing, Pulsed laser operation, Neodymium, Plasma physics, Plasma, Physics, High power lasers

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SPIE Journal Paper | 8 October 2014

Measuring effective area of spots from pulsed laser beams

Aurel Stratan, Alexandru Zorila, Laurentiu Rusen, George Nemes

OE, Vol. 53, Issue 12, 122513, (October 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.12.122513

KEYWORDS: Signal to noise ratio, Cameras, CCD cameras, Pulsed laser operation, Standards development, Beam analyzers, CCD image sensors, Charge-coupled devices, Optical engineering, Computer simulations

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SPIE Journal Paper | 31 May 2013

Measuring the effective pulse duration of nanosecond and femtosecond laser pulses for laser-induced damage experiments

Alexandru Zorila, Laurentiu Rusen, Aurel Stratan, George Nemes

OE, Vol. 52, Issue 05, 054203, (May 2013) https://doi.org/10.1117/12.10.1117/1.OE.52.5.054203

KEYWORDS: Pulsed laser operation, Femtosecond phenomena, Photodiodes, Oscilloscopes, Laser induced damage, Standards development, Optical engineering, Laser damage threshold, Error analysis, Ultrafast phenomena

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Proceedings Article | 4 December 2012 Paper

Automated test station for laser-induced damage threshold measurements according to ISO 21254-1,2,3,4 standards

Aurel Stratan, Alexandru Zorila, Laurentiu Rusen, Sandel Simion, Constantin Blanaru, Constantin Fenic, Liviu Neagu, George Nemes

Proceedings Volume 8530, 85301Y (2012) https://doi.org/10.1117/12.976845

KEYWORDS: Silica, Laser induced damage, Laser damage threshold, Standards development, Pulsed laser operation, Camera shutters, Sensors, Signal processing, Dielectrics, Error analysis

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Proceedings Article | 5 June 2008 Paper

Picosecond laser system based on microchip oscillator seed

Razvan Dabu, Aurel Stratan, Constantin Fenic, Constantin Blanaru, Laurentiu Rusen

Proceedings Volume 7022, 70221B (2008) https://doi.org/10.1117/12.804110

KEYWORDS: Laser systems engineering, Optical amplifiers, Picosecond phenomena, Ultraviolet radiation, Nd:YAG lasers, Crystals, Infrared radiation, Oscillators, Mirrors, Laser crystals

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Proceedings Article | 1 August 2007 Paper

Single frequency green nanosecond Nd:YAG microlaser-oscillator power-amplifier system

R. Dabu, C. Blanaru, A. Stratan, O. Pacala, C. Fenic, L. Neagu, L. Rusen, D. Ursu, V. Tornari, Y. Orphanos

Proceedings Volume 6785, 678508 (2007) https://doi.org/10.1117/12.755498

KEYWORDS: Crystals, Mirrors, Nd:YAG lasers, Reflectivity, Fabry–Perot interferometers, Q switched lasers, Laser systems engineering, Laser development, Resonators, Semiconductor lasers

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Proceedings Article | 25 April 2007 Paper

Processing of synthetic and natural diamond dies with AO Q-switched Nd:YAG laser

C. Fenic, C. Blanaru, O. Pacala, A. Stratan, R. Dabu, M. Zamfirescu, L. Rusen, L. Neagu, G. Voicu

Proceedings Volume 6606, 660617 (2007) https://doi.org/10.1117/12.729501

KEYWORDS: Diamond, Laser drilling, Mirrors, Nd:YAG lasers, Objectives, Adaptive optics, Laser processing, Crystals, Q switched lasers, Laser systems engineering

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Proceedings Article | 21 October 2004 Paper

Nd:YAG microchip laser frequency doubling with periodically poled and conventional type II KTP crystals

Razvan Dabu, Aurel Stratan, Constantin Fenic, Constantin Ungureanu, Liviu Neagu, Laurentiu Rusen

Proceedings Volume 5581, (2004) https://doi.org/10.1117/12.582792

KEYWORDS: Crystals, Nonlinear crystals, Laser crystals, Ferroelectric materials, Nd:YAG lasers, Second-harmonic generation, Semiconductor lasers, Infrared radiation, Q switched lasers, Phase matching

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Proceedings Article | 9 August 2002 Paper

Laser cleaning in the process of electronic device production

Ion Apostol, Dumitru Ulieru, Razvan Dabu, Constantin Ungureanu, L. Rusen

Proceedings Volume 4762, (2002) https://doi.org/10.1117/12.478642

KEYWORDS: Silicon, Semiconductor lasers, Silicon films, Semiconducting wafers, Microelectronics, Thin films, Laser applications, Laser ablation, Metals, Electronic components

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Showing 5 of 9 publications

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