Ms. Loes Crama Profile

Loes Crama

at cosine measurement systems

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Publications (3)

Proceedings Article | 21 August 2024 Poster + Paper

Data handling for the production of the NewAthena optics

Giuseppe Vacanti, Luis Abalo, Nicolas Barrière, Alex Bayerle, Donny de Borst, Luigi Castiglione, Abdelhakim Chatbi, Maximilien Collon, Loes Crama, Noë Eenkhoorn, David Girou, Ramses Günther, James Harpur, Enrico Hauser, Jasper den Hollander, Yvette Jenkins, Laurens Keek, Christian Körnig, Boris Landgraf, Adam Lassise, Sebastian Obwaller, Ben Okma, Paulo da Silva Ribeiro, Chris Rizos, Aniket Thete, Mark Vervest, Roel Visser, Luc Voruz

Proceedings Volume 13093, 130934R (2024) https://doi.org/10.1117/12.3019866

KEYWORDS: Mirrors, X-ray optics, Silicon, Metrology, X-rays, Wafer level optics, Semiconducting wafers, Inspection, Robots, Optical surfaces

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Proceedings Article | 21 August 2024 Presentation + Paper

Silicon pore x-ray optics for the NewAthena telescope

Maximilien Collon, Luis Abalo, Nicolas Barrière, Alex Bayerle, Donny De Borst, Luigi Castiglione, Loes Crama, Abdelhakim Chatbi, Noë Eenkhoorn, David Girou, Ramses Günther, James Harpur, Enrico Hauser, Jasper den Hollander, Yvette Jenkins, Boris Landgraf, Adam Lassise, Laurens Keek, Christian Körnig, Sebastian Obwaller, Ben Okma, Paulo da Silva Ribeiro, Chris Rizos, Aniket Thete, Giuseppe Vacanti, Sjoerd Verhoeckx, Mark Vervest, Roel Visser, Luc Voruz, Marcos Bavdaz, Ivo Ferreira, Eric Wille, Pieter Smid, Mathijs Bosman, Jeroen Haneveld, Arenda Koelewijn, Jan-Joost Lankwarden, Mark Olde Riekerink, Bart Schurink, Ronald Start, Maurice Wijnperle, Levent Cibik, Robert Fechner, Michael Krumrey, Dieter Skroblin, Vadim Burwitz, Finn Christensen, Desirée Della Monica Ferreira, Sonny Massahi, Diego Sanz, Sara Svendsen, Ethan Dunnell, Paul Lupton, William Mundon, Andrew Rees, Carles Colldelram, Dominique Heinis, Alejandro Sánchez, Norman Niewrzella, Stefano Basso, Alberto Moretti, Bianca Salmaso, Daniele Spiga

Proceedings Volume 13093, 1309319 (2024) https://doi.org/10.1117/12.3019675

KEYWORDS: Mirrors, X-rays, X-ray optics, Silicon, Semiconducting wafers, Optical benches, Spatial resolution, Optics manufacturing, X-ray telescopes, Robots

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Proceedings Article | 5 October 2023 Presentation + Paper

High-resolution and light-weight silicon pore x-ray optics

Boris Landgraf, Luis Abalo, Nicolas Barrière, Alex Bayerle, Donny de Borst, Luigi Castiglione, Maximilien Collon, Loes Crama, Abdelhakim Chatbi, Noë Eenkhoorn, David Girou, Ramses Günther, Enrico Hauser, Roy van der Hoeven, Jasper den Hollander, Yvette Jenkins, Adam Lassise, Laurens Keek, Christian Körnig, Sebastian Obwaller, Ben Okma, Paulo da Silva Ribeiro, Chris Rizos, Aniket Thete, Giuseppe Vacanti, Sjoerd Verhoeckx, Mark Vervest, Roel Visser, Luc Voruz, Marcos Bavdaz, Eric Wille, Ivo Ferreira, Mathijs Bosman, Jeroen Haneveld, Arenda Koelewijn, Jan-Joost Lankwarden, Mark Olde Riekerink, Bart Schurink, Ronald Start, Maurice Wijnperle, Coen van Baren, Levent Cibik, Michael Krumrey, Dieter Skroblin, Vadim Burwitz, Finn Christensen, Desirée Della Monica Ferreira, Sonny Massahi, Diego Sanz, Sara Svendsen, Ethan Dunnell, Paul Lupton, William Mundon, Andrew Rees, Dan Watley

Proceedings Volume 12679, 1267903 (2023) https://doi.org/10.1117/12.2678106

KEYWORDS: Mirrors, Silicon, X-ray optics, Semiconducting wafers, Wafer-level optics, X-rays, Synchrotron radiation, Ion beam finishing, Mirror surfaces, Laser cutting

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