Dr. Lu Zhang Profile

Dr. Lu Zhang

Ph.D candidate at Xi'an Jiaotong Univ

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Author

Publications (10)

SPIE Journal Paper | 15 August 2018 Open Access

Clinical lymphocytes construction for light scattering inversion study: a three-dimensional morphology constructed method from defective confocal images

Lu Zhang, Yunhao Xie, Yingzhe Tu, Lele Luo, Kaixing Li, Li Yuan, Wei Chen, Hong Zhao, Zhenxi Zhang

JBO, Vol. 23, Issue 08, 085003, (August 2018) https://doi.org/10.1117/12.10.1117/1.JBO.23.8.085003

KEYWORDS: Light scattering, Confocal microscopy, 3D image processing, Optical spheres, 3D modeling, Luminescence, Scattering, Microscopes, Blood, Lithium

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SPIE Journal Paper | 1 May 2010

Design of an optical system consisting of a special telecentric lens for side-scattering measurement on individual cells

Lu Zhang, Hong Zhao, Weibin Dong, Nan Cao, Pengfei Zhang

OE, Vol. 49, Issue 05, 053001, (May 2010) https://doi.org/10.1117/12.10.1117/1.3425657

KEYWORDS: Light scattering, Scattering, Stray light, Optical design, Spatial filters, Optical filters, Lens design, Scatter measurement, Optical engineering, Optical alignment

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Proceedings Article | 17 June 2009 Paper

Sheath flow stability controlling research in dynamic individual particles scattering measurement

Lu Zhang, Hong Zhao, Pengfei Zhang, Xiang Zhou, Jinjun Li

Proceedings Volume 7389, 738928 (2009) https://doi.org/10.1117/12.824666

KEYWORDS: Particles, Scattering, Image processing, Charge-coupled devices, Scatter measurement, Light scattering, Laser scattering, Signal detection, Error analysis, Digital image processing

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Proceedings Article | 17 June 2009 Paper

New approach to workpiece localization in subaperture stitching interferometric testing

Pengfei Zhang, Hong Zhao, Tao Jiang, Jinjun Li, Xiang Zhou, Lu Zhang

Proceedings Volume 7389, 738927 (2009) https://doi.org/10.1117/12.824663

KEYWORDS: Optical spheres, Interferometry, Calibration, Fizeau interferometers, Optical testing, Aspheric lenses, Interferometers, 3D metrology, Fringe analysis, 3D vision

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Proceedings Article | 3 October 2008 Paper

Development of a multi-resolution measurement system based on light sectioning method

Weiguang Zhang, Hong Zhao, Xiang Zhou, Lu Zhang

Proceedings Volume 7155, 715538 (2008) https://doi.org/10.1117/12.814618

KEYWORDS: Cameras, Calibration, Imaging systems, 3D metrology, Data fusion, Image processing, Error analysis, Control systems, Systems modeling, 3D modeling

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Proceedings Article | 3 October 2008 Paper

The study of sheath flow dark zone phenomenon in dynamic individual cells scattering measurement

Lu Zhang, Hong Zhao, Xiaopin Wang, Weiguang Zhang

Proceedings Volume 7155, 71552U (2008) https://doi.org/10.1117/12.814604

KEYWORDS: Scattering, Reflection, Scatter measurement, Signal detection, Light scattering, Laser scattering, Rayleigh scattering, Particles, Dynamic light scattering, Quartz

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Proceedings Article | 11 August 2008 Paper

A sensing system for monitoring the thickness of thin films by spectrum analysis of white-light interference

Yongkai Zhu, Lu Zhang, Haitao Wang, Hong Zhao

Proceedings Volume 7064, 70640R (2008) https://doi.org/10.1117/12.793269

KEYWORDS: Thin films, Signal processing, Sensing systems, Spectrum analysis, Spectroscopy, Optical fibers, Beam splitters, Data processing, Ocean optics, Signal to noise ratio

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Proceedings Article | 10 October 2007 Paper

A novel method in spectroscopy signal processing

Lu Zhang, Hong Zhao, Xiaopin Wang

Proceedings Volume 6716, 671602 (2007) https://doi.org/10.1117/12.754171

KEYWORDS: Spectroscopy, Signal processing, Thin films, Reflectance spectroscopy, Reflection, Wavelets, Wavelet transforms, Calibration, Signal analyzers, Optical fibers

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Many methods for spectroscopy signal analysis have been employed to extract useful and correct signals from measured data, such as Fourier analysis, wavelet analysis and so on. However, Fourier analysis is only suitable for stationary signal processing. Although wavelet transform is capable of analyzing non-stationary signals, many deficiencies have been reported in the use of wavelet transform. Non-adaptive nature is one of its disadvantages. Once the basic wavelet is selected, one will have to use it to analyze all the data. And the number of levers that the signal will be decomposed into must be decided by user and the frequency bands of all lever signals are fixed. Due to the deficiencies of wavelet transform, Huang et al. proposed a new type of signal processing method called empirical mode decomposition (EMD), with which any complicated data set can be decomposed into a finite and often small number of Intrinsic Mode Functions (IMFs). This method is suitable for non-linear and non-stationary data processing and has advantages that wavelet analysis has. In this paper EMD method is used in spectroscopy signal processing. And it is just in the infant period for spectroscopy signal processing. In order to verify the rationality and feasibility of EMD, polystyrene thin film is chosen as the testing sample. Its reflection interference spectroscopy is collected by the spectrometer made by Ocean Optics Company. And then the EMD approach for processing the reflection interference spectrum of polystyrene film is discussed. The sifting process in EMD can be stopped by predetermined criteria. And the number of IMF is selfadaptive. For choosing suitable number of IMF, the variance standard has been selected in this paper, with which the quality of the processing results can be optimized. Then the thickness of the polystyrene film can be calculated from the extracted spectrum by EMD. Comparing the thickness with the calibrated value, the error is below 1%, which proved that the proposed method is efficient and accurate in spectroscopy signal analysis.

Proceedings Article | 23 February 2006 Paper

Optical fiber direct-sensing biosensor applied in detecting biolayer thickness of nanometer grade

Yan Sun, Mingming Li, Hong Zhao, Yu Xiao Yang, Lu Zhang

Proceedings Volume 6150, 61502Z (2006) https://doi.org/10.1117/12.678575

KEYWORDS: Optical fibers, Biosensors, Proteins, Phase shifting, Spectrophotometry, Reflection, Signal processing, Interfaces, Light, Charge-coupled devices

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Proceedings Article | 23 February 2006 Paper

Analysis of double peak phenomenon in detecting the thickness of thin film

Yan Sun, Mingming Li, Hong Zhao, Lu Zhang

Proceedings Volume 6150, 61504T (2006) https://doi.org/10.1117/12.676733

KEYWORDS: Thin films, Optical fibers, Reflectance spectroscopy, Spectroscopy, Polymer thin films, Polymers, Refractive index, Spectrum analysis, Lead, Light sources

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Showing 5 of 10 publications

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