One of the most commonly performed ophthalmic surgeries is the replacement of the eye lens by a synthetic intraocular
lens.
Because of the trend to match the intraocular lens with the properties of the individual eye, intricate designs for IOLs
have been developed. Multifocal, diffractive as well as aspheric designs demand for elaborate measurement and analysis
options.
Various measurement methods have evolved including techniques which analyze the image itself or the emerging wavefront. In order to understand the advantages of these different methods intraocular lenses of various designs have been measured and analyzed under miscellaneous conditions. Measurement results of this comparison will be presented.
Aspheric lenses are of increasing importance in compact imaging systems. New developments in production
technologies have led to the so called wafer level production with several thousands of lenses on a single wafer.
This high volume production demands fast testing equipment which allows for the characterization of complete imaging
systems as well as of all of its single components. In most of the cases conventional methods cannot be used to measure
single lenses or objectives in earlier production states. Although e.g. the measurement of the modulation transfer
function is a well established method for fast and accurate quality inspection of entire objectives it has its limitation for
single lenses.
Due to its very large dynamic range the Shack-Hartmann sensor is able to measure a very broad range of spherical and
aspherical lenses as well as partially or fully assembled objectives. With the combination of a fast high accuracy
wavefront sensor and special positioning algorithms which allow for high throughput in mass production a new flexible
instrument has been developed.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.