KEYWORDS: Object detection, Data modeling, Education and training, Visual process modeling, 3D modeling, Performance modeling, Retina, Systems modeling, Computer vision technology, Sensors
Deep neural networks (DNNs), enabled by massive open datasets like ImageNet, have produced impressive results in a wide range of fields and applications. ImageNet, a database of over 15 million high-resolution images categorized into 22,000 categories, has revolutionized the field of computer vision with state-of-the-art models achieving 98% accuracy. However, this performance comes at a cost. Recent advances in adversarial machine learning have revealed inherent vulnerabilities in DNN-based models. Adversarial patches have been successfully used to disrupt the performance of artificial intelligence (AI) systems that leverage DNN-based computer vision models, but the trade space of these attacks is not fully understood; adversarial attack generation and validation methods are still nascent. In this paper we explore the generation and performance of synthetically-trained attacks against models trained on real data like MSCOCO, VIRAT and VisDrone. Using a synthetic environment tool built on the Unreal Engine, we generate a synthetic dataset consisting of pedestrians and vehicles, train synthetic object detection models, and optimize adversarial patch attacks on the synthetic feature space of those models. We then apply our synthetic attacks to real image data and examine the efficacy of synthetic patch attacks against models trained on real-word image data. The implications of synthetically optimized attacks are broad: a much larger attack surface for DNN-based computer vision models, development of simulation-based validation pipelines, more effective attacks, and stronger defenses against adversarial examples.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.