CONFERENCE PROCEEDINGS
Advanced Search
Maruko Wu
at Onto Innovation Inc.
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 10 April 2024 Poster + Paper
Using deep learning ADC for defect classification for automatic defect inspection
Proceedings Volume 12955, 129551X (2024) https://doi.org/10.1117/12.3000815
KEYWORDS: Analog to digital converters, Deep learning, Machine learning, Education and training, Image classification, Evolutionary algorithms, Performance modeling, Matrices, Library classification systems, Image processing
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top