Polymer blending is a powerful approach to expand the nanopatterning landscape for block copolymer (BCP) directed self-assembly, itself a promising route to enhance resolution in established lithography techniques. However, investigating the vast and complex parameter spaces associated with blend self-assembly remains a daunting challenge. This talk will highlight examples where blending BCPs with homopolymers can dramatically speed up self-assembly kinetics for potential applications from nanophotonics to membrane synthesis, while blending two BCPs enables registered, template-responsive pattern selection. I will further describe ongoing efforts to accelerate investigations of blend formulation and processing using new combinatorial and autonomous methods.
With the advent of high brightness sources and fast detectors, there is a possibility for combining fast X-ray acquisition with high-speed data treatment to reach the timescale for an effective in-line characterization method. We will highlight two recent developments using Small Angle X-ray Scattering on nanoscale etched patterns: the first is the inclusion of a CD-SAXS tool, allowing the data treatment and simulations to reconstruct the form-factor, inside the Xi-cam framework; the second is the development of a high performance Grazing Incidence approach to reconstruct the shape of line profile. This study also shows the comparison between the line profiles reconstructed from both techniques as well as the profile extracted from cross-section SEM.
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