Massih Foroughipour
at Technische Univ Wien
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 July 2017 Paper
Saiedeh Saghafi, Nikoo Haghi-Danaloo, Klaus Becker, Massih Foroughipour, Hans-Ulrich Dodt
Proceedings Volume 10414, 104140A (2017) https://doi.org/10.1117/12.2286083
KEYWORDS: Modal analysis, Microscopy, Gaussian beams, Beam shaping

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