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Dr. Mircea G. Modreanu
at Univ College Cork
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Author
Publications (5)
Proceedings Article | 18 March 2013 Paper
Optical, microstructural, vibrational and theoretical studies of p-type SrCu2O2 and BaCu2O2 transparent conductive oxides
J. Even, L. Pedesseau, M. Modreanu, G. Huyberechts, B. Servet, Guy Garry, O. Chaix-Pluchery, O. Durand
Proceedings Volume 8626, 86261Y (2013) https://doi.org/10.1117/12.2014328
KEYWORDS: Raman spectroscopy, Oxides, Crystals, Chemical species, Dielectrics, Barium, Transparent conductors, Phonons, Raman scattering, Doping
Proceedings Article | 4 February 2013 Paper
Structural and optical properties of (In,Ga)As/GaP quantum dots and (GaAsPN/GaPN) diluted-nitride nanolayers coherently grown onto GaP and Si substrates for photonics and photovoltaics applications
O. Durand, C. Robert, T. Nguyen Thanh, S. Almosni, T. Quinci, J. Kuyyalil, C. Cornet, A. Létoublon, C. Levallois, J.-M. Jancu, J. Even, L. Pédesseau, M. Perrin, N. Bertru, A. Sakri, N. Boudet, A. Ponchet, P. Rale, L. Lombez, J.-F. Guillemoles, X. Marie, A. Balocchi, P. Turban, S. Tricot, Mircea Modreanu, S. Loualiche, A. Le Corre
Proceedings Volume 8631, 863126 (2013) https://doi.org/10.1117/12.2012670
KEYWORDS: Silicon, Interfaces, Quantum wells, Luminescence, Solar cells, Optical properties, Transmission electron microscopy, Reflection, Nitrogen, Quantum dots
Proceedings Article | 3 June 2005 Paper
Optical and structural characterization of as-deposited and annealed ZrO2 thin films obtained by PIAD
Proceedings Volume 5826, (2005) https://doi.org/10.1117/12.606694
KEYWORDS: Annealing, Refractive index, X-ray diffraction, X-rays, Crystals, Thin films, Reflectometry, Optical properties, Silicon, Diffraction
Proceedings Article | 27 August 2003 Paper
Optical characterization of high-k dielectrics HfO2 thin films obtained by MOCVD
Mircea Modreanu, P. Hurley, B. O'Sullivan, Breda O'Looney, Jean-Pierre Senateur, H. Rousell, F. Rousell, M. Audier, C. Dubourdieu, Ian Boyd, Q. Fang, T. Leedham, S. Rushworth, A. Jones, Hywel Davies, C. Jimenez
Proceedings Volume 4876, (2003) https://doi.org/10.1117/12.463984
KEYWORDS: Chemical vapor deposition, Hybrid fiber optics, Annealing, Ultraviolet radiation, Thin films, Interfaces, Refractive index, Statistical modeling, FT-IR spectroscopy, Oxygen
Proceedings Article | 27 August 2003 Paper
Heterojunction bipolar transistor characterization using noncontact optical spectroscopy
Martin Murtagh, Patrick Kelly, Breda O'Looney, Frank Murphy, Mircea Modreanu
Proceedings Volume 4876, (2003) https://doi.org/10.1117/12.467862
KEYWORDS: Indium gallium phosphide, Gallium arsenide, Interfaces, Diffraction, Data modeling, Heterojunctions, Transmission electron microscopy, Transistors, Gallium, Optical spectroscopy
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