CONFERENCE PROCEEDINGS
Advanced Search
Mohammed Harb
IC Design Consultant at Siemens EDA
SPIE Involvement:
Author
Publications (2)
Proceedings Article | 16 March 2016 Paper
A random approach of test macro generation for early detection of hotspots
Jong-hyun Lee, Chin Kim, Minsoo Kang, Sungwook Hwang, Jae-seok Yang, Mohammed Harb, Mohamed Al-Imam, Kareem Madkour, Wael ElManhawy, Joe Kwan
Proceedings Volume 9781, 97810J (2016) https://doi.org/10.1117/12.2218806
KEYWORDS: Defect detection, New and emerging technologies, Process modeling, Design for manufacturing, Silicon, Design for manufacturability, Particles, Visualization, Lithography
Proceedings Article | 12 April 2013 Paper
Hybrid OPC technique using model based and rule-based flows
Mohammed Harb, Hesham Abdelghany
Proceedings Volume 8683, 868327 (2013) https://doi.org/10.1117/12.2011497
KEYWORDS: Optical proximity correction, Model-based design, Photomasks, Lithography, Electronic design automation, Semiconducting wafers, 193nm lithography, Silicon, Wafer-level optics, Databases
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top