Moises Jaber Villaseñor
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 August 2020 Poster + Paper
Proceedings Volume 11502, 115020P (2020) https://doi.org/10.1117/12.2567671
KEYWORDS: Calibration, Mathematical modeling, 3D modeling, Fringe analysis, 3D metrology, Data modeling, Phase shifts, Digital Light Processing, CCD cameras

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