Prof. Moshe Sinvani
Associate Professor at Bar-Ilan Univ
SPIE Involvement:
Author
Publications (11)

Proceedings Article | 2 March 2020 Paper
Proceedings Volume 11267, 1126706 (2020) https://doi.org/10.1117/12.2545949
KEYWORDS: Silicon, Waveguides, Semiconductor lasers, Refractive index, Refraction, Crystals, Absorption, Scanning electron microscopy, Silicon photonics, Semiconducting wafers

Proceedings Article | 21 February 2020 Paper
Proceedings Volume 11254, 1125407 (2020) https://doi.org/10.1117/12.2546318
KEYWORDS: Laser beam diagnostics, Semiconductor lasers, Infrared imaging, Infrared lasers, Diffraction

Proceedings Article | 5 March 2019 Paper
Proceedings Volume 10891, 1089107 (2019) https://doi.org/10.1117/12.2508535
KEYWORDS: Silicon, Beam shaping, Absorption, Point spread functions, Diffraction, Super resolution, Refractive index

SPIE Journal Paper | 8 November 2018
Hadar Pinhas, Amir Shemer, Omer Wagner, Yossef Danan, Yafit Fleger, Yonathan Ramon, Meir Danino, Moshe Sinvani, Zeev Zalevsky
OE, Vol. 57, Issue 11, 115101, (November 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.11.115101
KEYWORDS: Silicon, Nanoparticles, Tunable filters, Fabry–Perot interferometers, Hyperspectral imaging, Optical filters, Spectral resolution, Refractive index, Near infrared, Optical engineering

Proceedings Article | 14 March 2018 Presentation
Eitan Weintraub, Ben Sachs, Yana Reznick, Moshe Sinvani, Rachel Lubart, Ehud Banin, Yevgeny Beiderman , Zeev Zalevsky
Proceedings Volume 10479, 104790B (2018) https://doi.org/10.1117/12.2287083
KEYWORDS: Inflammation, Light, Remote sensing, Sensing systems, Cameras, Imaging systems, Light sources, Bacteria

Showing 5 of 11 publications
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