Dr. Narcyz Blocki Profile

Dr. Narcyz Blocki

at Institute of Applied Optics

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Author

Publications (8)

Proceedings Article | 5 October 2017 Paper

Photonic technology revolution influence on the defence area

Jacek Galas, Dariusz Litwin, Narcyz Błocki, Marek Daszkiewicz

Proceedings Volume 10434, 104340J (2017) https://doi.org/10.1117/12.2292260

KEYWORDS: Photonic integrated circuits, Defense technologies, Defense and security, Radar, Indium oxide, Defense systems, Telecommunications, Phase measurement, Analytical research, Integrated optics

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Proceedings Article | 27 April 2006 Paper

Automated variable wavelength interferometry in reflected light mode

D. Litwin, J. Galas, N. Blocki

Proceedings Volume 6188, 61880F (2006) https://doi.org/10.1117/12.662238

KEYWORDS: Prisms, Microscopes, Wavefronts, Interferometry, Digital image correlation, Refractive index, Polarizers, Computing systems, Optics manufacturing, Birefringence

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Proceedings Article | 24 September 2005 Paper

Simple optical method of qualitative assessment of sperm motility: preliminary results

Agnieszka Sozanska, Krystyna Kolwas, Jacek Galas, Narcyz Blocki, Adam Czyzewski

Proceedings Volume 5959, 59590U (2005) https://doi.org/10.1117/12.622825

KEYWORDS: Microscopes, In vitro testing, Image processing, CCD cameras, Motion analysis, Visualization, Phase contrast, Statistical analysis, Data acquisition, Error analysis

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Proceedings Article | 13 June 1997 Paper

Laser scanning tomograph as the tool for investigation of semiconductor materials

Jacek Galas, Marek Daszkiewicz, Tomasz Kozlowski, Narcyz Blocki

Proceedings Volume 3179, (1997) https://doi.org/10.1117/12.276218

KEYWORDS: Light scattering, Semiconducting wafers, Infrared cameras, Semiconductor materials, Laser scanners, Scattering, Laser scattering, CCD cameras, Infrared radiation, Infrared imaging

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Proceedings Article | 1 September 1995 Paper

Optoelectronic scanning device for the observation of scattering of YAG laser light in semiconductor materials

Marek Daszkiewicz, Jacek Galas, Tomasz Kozlowski, Narcyz Blocki, Marta Pawlowska, Andrzej Hruban

Proceedings Volume 2541, (1995) https://doi.org/10.1117/12.218334

KEYWORDS: Semiconducting wafers, Infrared cameras, Light scattering, Semiconductor materials, Laser scattering, Scattering, Infrared radiation, CCD cameras, YAG lasers, Cameras

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Proceedings Article | 31 October 1994 Paper

Measurement of the diameter of wires and fibers by using CCD line-scan detector

Narcyz Blocki, Marek Daszkiewicz, Jacek Galas

Proceedings Volume 1991, (1994) https://doi.org/10.1117/12.192010

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Proceedings Article | 24 September 1993 Paper

Fourier transform spectrometry of interference filters by using double-refracting microinterferometry

Narcyz Blocki

Proceedings Volume 1711, (1993) https://doi.org/10.1117/12.155650

KEYWORDS: Prisms, Spectroscopy, Interference filters, Microscopes, Optical filters, Interferometry, CCD cameras, Fourier transforms, Information technology, Calibration

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Proceedings Article | 1 December 1991 Paper

Computer-driven Fourier diffractometer

Narcyz Blocki, Marek Daszkiewicz, Jacek Galas

Proceedings Volume 1562, (1991) https://doi.org/10.1117/12.50795

KEYWORDS: Diffraction, Mirrors, Signal detection, Optical signal processing, Sensors, Lenses, Image analysis, Spatial frequencies, Image segmentation, Bone

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Showing 5 of 8 publications

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