Overcoming technical performance limitations in the detection and characterization of terahertz (THz) radiation will enable ground-breaking scientific advances from the study of fast and non-reproducible phenomena to enabling THz quantum applications that require single-photon sensitivity. Electro-optic sampling techniques intrinsically rely on the acquisition of multiple data points to reconstruct the full THz waveform, which leads to long data acquisition times, and prevents the detection of single photons. We have developed two distinct and highly sensitive detection techniques for pulsed THz radiation: i) a single-pulse measurement which employs chirped-pulse spectral encoding and a dispersive Fourier transform method for time-resolved THz spectroscopy at a demonstrated rate of 50 kHz; and ii) a single-THz-photon detection technique based on parametric frequency conversion and single-photon counting technology capable of detecting THz pulses at the zeptojoule level. These extreme detection schemes will lay the foundation for THz applications in the single-pulse and single-photon regimes.
Dispersive Fourier method gives access to spectral information by mapping them in the time domain. This facilitates shot-to-shot spectroscopy of rapidly changing systems. We adapted this technique to demonstrate time-resolved THz spectroscopy at 50 kHz repetition rate by encoding the THz waveform onto the spectral components of spectrally broadened (NIR) ultrafast laser pulses.
The rapid acquisition of terahertz (THz) time-domain waveforms is a significant challenge in the study of fast and non-reproducible phenomena. To increase data acquisition rates, the THz waveform can be encoded on spectral components of individual near-infrared (NIR) ultrafast laser pulses. By using dispersive Fourier transform method, where spectral information are mapped in the time domain, we demonstrate time-resolved THz-spectroscopy at an unprecedented rate of 50 kHz. With this technique, we resolve sub-millisecond dynamics of carriers in silicon injected by successive resonant pulses as a saturation density is established.
Terahertz time-domain spectroscopy (THz-TDS) is a method used in research and industry for non-invasive characterization of products and materials. Many THz-TDS systems rely on parametric conversion in semiconductor crystals to generate and detect phase-locked THz pulses, providing reliable access to frequencies below 3 THz. Accessing higher frequencies, however, often requires a sophisticated near-infrared (NIR) source delivering sub- 100 fs pulses to access the required spectral bandwidth and thin nonlinear crystals (few hundred micrometers thick) to minimize phase mismatch during both the THz generation and detection processes. As a result, broadband THz- TDS configurations rely on laser systems which are often bulky and costly, resulting in inefficient THz generation and detection processes due to a limited nonlinear interaction length in the crystals. To overcome these limitations, we introduce three modules to a THz-TDS system employing a compact and cost-effective pulsed laser. First, a fiberbased component is used to broaden the output laser spectrum and compress the pulse duration. This module provides the NIR frequency content needed for broadband THz generation through optical rectification and a pulse duration short enough to efficiently resolve high THz frequencies during electro-optic sampling. The other two modules utilize a thick nonlinear crystal with a periodically patterned surface to optimize the efficiencies of the broadband THz generation and detection processes. In this configuration, a long nonlinear interaction length is guaranteed while noncollinear phase matching provides access to a broad spectral range. The combination of these modules extends the THz spectrum from 3 THz to beyond 6 THz with a peak dynamic range >50 dB at 3.5 THz.
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