Oelof A. Kruger
at Council for Scientific and Industrial Research
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 October 2001 Paper
Proceedings Volume 4401, (2001) https://doi.org/10.1117/12.445642
KEYWORDS: Interferometers, Calibration, Interferometry, Metrology, Mirrors, Cameras, Temperature metrology, Laser metrology, Standards development, Phase shifting

Conference Committee Involvement (1)
Recent Developments in Traceable Dimensional Measurements II
4 August 2003 | San Diego, California, United States
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