Prof. Ola Hunderi Profile

Prof. Ola Hunderi

Professor at Norwegian Univ of Science and Technology

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Author

Publications (6)

Proceedings Article | 25 April 2008 Paper

Numerical simulations of interferometrical deformation measurements in multi-layered objects

Kay Gastinger, Pål Løvhaugen, Ola Hunderi

Proceedings Volume 6995, 69950H (2008) https://doi.org/10.1117/12.784444

KEYWORDS: Glasses, Interfaces, Sensors, Ray tracing, Interferometry, Microelectromechanical systems, Phase measurement, Geometrical optics, Silicon, Cameras

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Proceedings Article | 18 June 2007 Paper

Multi-technique platform for dynamic and static MEMS characterisation

Kay Gastinger, Pål Løvhaugen, Øystein Skotheim, Ola Hunderi

Proceedings Volume 6616, 66163K (2007) https://doi.org/10.1117/12.726307

KEYWORDS: Interfaces, Sensors, Glasses, Microelectromechanical systems, Interferometry, Digital holography, Semiconducting wafers, Speckle, Cameras, Lithium

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Proceedings Article | 30 November 2004 Paper

Determination of the phase- and polarization-changing properties of reflective spatial light modulators in one set-up

Frantz Stabo-Eeg, Kay Gastinger, Ola Hunderi, Mikael Lindgren

Proceedings Volume 5618, (2004) https://doi.org/10.1117/12.578438

KEYWORDS: Polarization, Spatial light modulators, Liquid crystals, Polysomnography, Reflectivity, Beam splitters, Optical components, Polarizers, Phase shifts, Phase measurement

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Proceedings Article | 8 March 2001 Paper

Overcoming the cut-off effect in the propagation of LRSP in a GaAs-Au-GaAs system

Viktoras Vaicikauskas, Johannes Bremer, Ola Hunderi, Romas Antanavicius

Proceedings Volume 4318, (2001) https://doi.org/10.1117/12.417601

KEYWORDS: Wave propagation, Infrared radiation, Polaritons, FT-IR spectroscopy, Polarization, Infrared imaging, Light wave propagation

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Proceedings Article | 26 September 2000 Paper

Wavelength dependence of the light scattered from a dielectric film deposited on a metal substrate

Ingve Simonsen, Tamara Leskova, Alexei Maradudin, Ola Hunderi

Proceedings Volume 4100, (2000) https://doi.org/10.1117/12.401667

KEYWORDS: Scattering, Dielectrics, Interfaces, Light scattering, Metals, Reflectivity, Silver, Numerical simulations, Reflection, Plasma

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Proceedings Article | 19 August 1996 Paper

Real-time monitoring by multiwavelength ellipsometry of the growth of silicon alloy multilayers and gradient index structures

Morten Kildemo, S. Deniau, Pavel Bulkin, Bernard Drevillon, Ola Hunderi

Proceedings Volume 2776, (1996) https://doi.org/10.1117/12.246805

KEYWORDS: Refractive index, Multilayers, Feedback control, Ellipsometry, Optical coatings, Gradient-index optics, Plasma, Modulation, Process control, Reflection

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Showing 5 of 6 publications

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