Peilin Yan
at National Institute of Metrology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 November 2024 Paper
Proceedings Volume 13237, 1323708 (2024) https://doi.org/10.1117/12.3036037
KEYWORDS: Projection systems, Cameras, Machine vision, Calibration, Inspection, Curtains, Tunable filters, Superposition, Optical filters, Imaging systems

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