We have quantitatively modeled the conduction current and charge storage of an HFET in terms its physical
dimensions and material properties. For DC or small-signal RF operation, no adjustable parameters are necessary to
predict the terminal characteristics of the device. Linear performance measures such as small-signal gain and input
admittance can be predicted directly from the geometric structure and material properties assumed for the device design.
We have validated our model at low-frequency against experimental I-V measurements and against two-dimensional
device simulations. We discuss our recent extension of our model to include a larger class of electron velocity-field
curves. We also discuss the recent reformulation of our model to facilitate its implementation in commercial large-signal
high-frequency circuit simulators.
Large signal RF operation is more complex. First, the highest CW microwave power is fundamentally bounded
by a brief, reversible channel breakdown in each RF cycle. Second, the highest experimental measurements of efficiency,
power, or linearity always require harmonic load pull and possibly also harmonic source pull. Presently, our model
accounts for these facts with an adjustable breakdown voltage and with adjustable load impedances and source
impedances for the fundamental frequency and its harmonics. This has allowed us to validate our model for large signal
RF conditions by simultaneously fitting experimental measurements of output power, gain, and power added efficiency
of real devices.
We show that the resulting model can be used to compare alternative device designs in terms of their large
signal performance, such as their output power at 1dB gain compression or their third order intercept points. In addition,
the model provides insight into new device physics features enabled by the unprecedented current and voltage levels of
AlGaN/GaN HFETs, including non-ohmic resistance in the source access regions and partial depletion of the 2DEG in
the drain access region.
KEYWORDS: Reliability, Gallium arsenide, Data modeling, Electrodes, Semiconductors, Field effect transistors, Amplifiers, Transistors, Device simulation, Ka band
High voltage HFET's fabricated from nitride semiconductors utilizing the AlGaN/GaN heterojunction or
GaAs using field plates demonstrate excellent RF output power performance. The nitride HFET's produce
RF output power greater than an order of magnitude higher than available from GaAs and InP based
devices, and GaAs FET's fabricated with field-plates can produce RF output power about a factor of two
greater than standard FET's. However, the FET's demonstrate a reliability problem where the dc current
and RF output power continually decrease as a function of time. The problem is more serious in the nitride
HFET's, although both nitride-based and GaAs-based devices suffer reliability problems. The reliability
problem is related to the conduction characteristics of the gate electrode and an electron tunneling
mechanism where electrons leak from the gate to the surface of the semiconductor. In this work the physics
responsible for this behavior are investigated and described. Physics-based models suitable for use in RF
circuit harmonic-balance simulators have been developed, with excellent agreement between measured and
simulated data. Design techniques to reduce the reliability problem will be discussed.
A novel optically-triggered (OT) interband resonant-tunneling-diode (I-RTD) device (based on AlGaSb/InAs/AlGaSb
heterostructures) concept for generating terahertz (THz) frequency oscillations has been previously presented that shows
promise for achieving enhanced output power levels under pulsed operation. The main concept is to utilize novel
nanoscale mechanisms to achieve an externally driven relaxation oscillation that consists of two phases. Namely, the
first phase is a valence band (VB) well hole-charging transient produced by a natural Zener (interband) tunneling
process and the second is a discharging transient induced by optical annihilation of the VB well hole-charge by
externally-injected photon flux. While the initial simulation results for a practical diode-laser implementation clearly
show the superiority of this new oscillator concept (i.e., excellent output power capability, ~10mW, over broad portions
of the THz regime, ~300-600GHz), the specific optical-triggering conditions required by the AlGaSb/InAs based
material systems (i.e., photonic-energy ~4.7 μm, intensity level ~3.5x107 W/cm2 and a pulse repetition frequency (PRF)
equal to the THz oscillation period) are technically too demanding to meet for continuous-wave (CW) mode operation.
Hence, this paper will report on variations and extensions of the original OT-I-RTD oscillator concept. Specifically,
modifications to the device structure will be considered to allow for OT operation at 1.55 μm where the optical
technology is more robust. Here the specific focus will be in the introduction of In1-xGaxAs /GaSbyAs1-y hetero-systems
and the application of band-engineering to assess the potential of a 1.55 μm based OT-I-RTD oscillator design.
The traditional implementation of resonant tunneling diodes (RTD) as a high-frequency power source always requires the utilization of negative-differential resistance (NDR). However, there are inherent problems associated with effectively utilizing the two-terminal NDR gain to achieve significant levels of output power. This paper will present a new design methodology where resonant tunneling structures (RTS) are engineered to exhibit electronic instabilities within the positive-differential-resistance (PDR) region. As will be demonstrated, this approach utilizes a microscopic instability that alleviates the need to reduce device area (and therefore output power) in an effort to achieve low-frequency stabilization.
The mission of the ARO is to seed scientifically sound and technologically important efforts which will enhance Army capabilities. Results of prior research activities have led to major changes in Army operations. The development of the laser provided a completely new capability to precisely measure the range to the target, and to designate targets. The Army's capability to fight at night was a direct result of scientific studies dealing with semiconductor materials and photoelectronic phenomena for image intensification.
KEYWORDS: Transistors, Chemical elements, High speed electronics, Capacitance, Data modeling, Heterojunctions, Fourier transforms, Field effect transistors, Microwave radiation, Diffusion
Extracted delay times provide information useful for device scaling. In this work a novel parameter extraction technique that permits delay times associated with the physical operation of the transistor, along with element values for an equivalent circuit, to be determined from terminal S-parameter measurements. The technique is employed to investigate the operation of mm-wave AlInAs/GalnAs/InP heterojunction bipolar transistors. High current phenomena, such as the onset of the Kirk Effect, are clearly evident. The results indicate that the base region delay is dominant in determining the high frequency operation of these devices.
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