Prof. Sang Yeol Lee
at Korea Institute of Science and Technology
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 20 February 2007 Paper
G. Kim, B. Ahn, D. Kim, K. Jung, S. Lee
Proceedings Volume 6474, 647409 (2007) https://doi.org/10.1117/12.699613
KEYWORDS: Silver, Zinc oxide, Thin films, Doping, Temperature metrology, Thermal analysis, Zinc, Pulsed laser deposition, X-rays, Photoemission spectroscopy

Proceedings Article | 26 May 1998 Paper
Dong Eun, Joo Park, Jeong Park, Sang Yeol Lee, Chang Park
Proceedings Volume 3404, (1998) https://doi.org/10.1117/12.308597
KEYWORDS: Thin films, Dielectrics, Laser ablation, Capacitors, Scanning electron microscopy, Pulsed laser deposition, Thin film growth, Capacitance, Crystals, X-ray diffraction

Proceedings Article | 26 May 1998 Paper
Young Jeong, Sang Yeol Lee
Proceedings Volume 3404, (1998) https://doi.org/10.1117/12.308610
KEYWORDS: Scanning electron microscopy, Laser ablation, Laser energy, Laser irradiation, Raman spectroscopy, Pulsed laser deposition, Thin films, Excimer lasers, Pulsed laser operation, Surface finishing

Proceedings Article | 26 May 1998 Paper
Young Jeong, Joo Park, Sang Yeol Lee
Proceedings Volume 3404, (1998) https://doi.org/10.1117/12.308603
KEYWORDS: Thin films, Superconductors, Pulsed laser deposition, Thin film deposition, X-ray diffraction, Resistance, Raman spectroscopy, Zirconium dioxide, Crystals, Scanning electron microscopy

Proceedings Article | 1 September 1995 Paper
Seok Han, Jeha Kim, Sang Yeol Lee, Kwang-Yong Kang
Proceedings Volume 2559, (1995) https://doi.org/10.1117/12.218171
KEYWORDS: Resonators, Superconductors, Thin films, Capacitance, Microwave radiation, Capacitors, Temperature metrology, Multilayers, Dielectrics, Data modeling

Showing 5 of 9 publications
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