Dr. Satoshi Kishimoto Profile

Dr. Satoshi Kishimoto

Senior Researcher at National Institute for Materials Science

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Author

Publications (15)

Proceedings Article | 17 July 2015 Paper

Deformation measurement of carbon fiber reinforced plastics using phase-shifting scanning electron microscope Moiré method after Fourier transform

Qinghua Wang, Shien Ri, Hiroshi Tsuda, Satoshi Kishimoto, Yoshihisa Tanaka, Yutaka Kagawa

Proceedings Volume 9524, 95240I (2015) https://doi.org/10.1117/12.2186145

KEYWORDS: Scanning electron microscopy, Phase shifting, Phase shifts, Fourier transforms, Moire patterns, Image filtering, Carbon, Electron microscopes, Image processing, Microscopes

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Proceedings Article | 28 March 2012 Paper

Measurement of strain distribution in smart materials by electron Moiré method

S. Kishimoto, H. Asanuma, Y. Tanaka, Y. Kagawa

Proceedings Volume 8341, 83411J (2012) https://doi.org/10.1117/12.915118

KEYWORDS: Electron beams, Optical fibers, Smart materials, Aluminum, Scanning electron microscopy, Composites, Electron beam lithography, Interfaces, Polishing, X-ray optics

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Proceedings Article | 15 April 2010 Paper

Meso-moiré fringe observation of nano-particle structures by electron moiré method

Satoshi Kishimoto, Yusuke Yamauchi

Proceedings Volume 7522, 75220L (2010) https://doi.org/10.1117/12.851593

KEYWORDS: Nanoparticles, Nanolithography, Electron beams, Scanning electron microscopy, System on a chip, Americium, Silica, Particles, Materials science, Scientific research

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A new method to measure the spacing and direction in the ordered assembled nanoparticles by using the electron Moiré new method to measure the spacing and direction in the ordered assembled nanoparticles by using the electron Moiré fringes has been developed. In this method an assembled nanoparticle array can be consider as a model grid. When the electron beam was irradiated on the top of the nanoparticles, the amount of secondary electrons per primary electron is quite large. On the other hand, when the electron beam was irradiated on the valley among the neighboring nanoparticles, the amount of secondary electrons per primary electron is smaller. The difference of the generated secondary electrons per a primary electron fabricate periodical bright and dark pattern, which is the electron mesomoiré fringes. Using this method, the spacing and orientation of the assembled nanoparticle array was measured. new method to measure the spacing and direction in the ordered assembled nanoparticles by using the electron Moiré fringes has been developed. In this method an assembled nanoparticle array can be consider as a model grid. When the electron beam was irradiated on the top of the nanoparticles, the amount of secondary electrons per primary electron is quite large. On the other hand, when the electron beam was irradiated on the valley among the neighboring nanoparticles, the amount of secondary electrons per primary electron is smaller. The difference of the generated secondary electrons per a primary electron fabricate periodical bright and dark pattern, which is the electron mesomoiré fringes. Using this method, the spacing and orientation of the assembled nanoparticle array was measured. fringes has been developed. In this method an assembled nanoparticle array can be consider as a model grid. When the electron beam was irradiated on the top of the nanoparticles, the amount of secondary electrons per primary electron is quite large. On the other hand, when the electron beam was irradiated on the valley among the neighboring nanoparticles, the amount of secondary electrons per primary electron is smaller. The difference of the generated secondary electrons per a primary electron fabricate periodical bright and dark pattern, which is the electron mesomoiré fringes. Using this method, the spacing and orientation of the assembled nanoparticle array was measured.

Proceedings Article | 25 August 2009 Paper

Closed cellular materials for smart materials

Satoshi Kishimoto

Proceedings Volume 7375, 73755T (2009) https://doi.org/10.1117/12.839356

KEYWORDS: Particles, Polymers, Surface plasmons, Ceramics, Polyurethane, Metals, Smart materials, Epoxies, Absorption, Plasma

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Proceedings Article | 31 March 2006 Paper

Fabrication methods of micrometallic closed cellular materials

Satoshi Kishimoto, Norio Shinya

Proceedings Volume 6172, 617216 (2006) https://doi.org/10.1117/12.658483

KEYWORDS: Particles, Metals, Polymers, Surface plasmons, Coating, Plasma, Scanning electron microscopy, Plasma systems, Absorption, Organic materials

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Proceedings Article | 7 March 2006 Paper

AFM scanning moire method for nanodeformation measurement

Huimin Xie, Gin Chai, Anand Asundi, Jin Yu, Yunguang Lu, Bryan Ngoi, Zhaowei Zhong, Satoshi Kishimoto

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498437

KEYWORDS: Moire patterns, Mica, Atomic force microscopy, Picosecond phenomena, Adhesives, YAG lasers, Nd:YAG lasers, CRTs, Mechanical engineering, Product engineering

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Proceedings Article | 12 April 2005 Paper

A new method to measure the distance between the micro-device and the substrate

Satoshi Kishimoto, George Johnson

Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621892

KEYWORDS: Distance measurement, Scanning electron microscopy, Sensors, Electron beams, Electron microscopes, Microelectromechanical systems, Experimental mechanics, Objectives, Materials science, Mechanical engineering

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Proceedings Article | 29 July 2004 Paper

New fabrication method of metallic closed cellular materials containing organic materials

Satoshi Kishimoto, Norio Shinya

Proceedings Volume 5389, (2004) https://doi.org/10.1117/12.540172

KEYWORDS: Particles, Organic materials, Metals, Surface plasmons, Polymers, Scanning electron microscopy, Absorption, Foam, Plating, Plasma systems

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Proceedings Article | 31 July 2003 Paper

Damping property of metallic closed cellular materials containing organic materials

Satoshi Kishimoto, Zhenlun Song, Norio Shinya

Proceedings Volume 5052, (2003) https://doi.org/10.1117/12.483812

KEYWORDS: Organic materials, Particles, Signal attenuation, Ultrasonics, Scanning electron microscopy, Electroless plating, Aluminum, Foam, Polymers, Metals

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Proceedings Article | 27 June 2002 Paper

Mechanical properties of metallic closed cellular materials containing organic materials for passive damping

Satoshi Kishimoto, Norio Shinya

Proceedings Volume 4697, (2002) https://doi.org/10.1117/12.472653

KEYWORDS: Organic materials, Particles, Signal attenuation, Ultrasonics, Metals, Scanning electron microscopy, Electroless plating, Polymers, Temperature metrology, Coating

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Proceedings Article | 20 July 1998 Paper

Development of closed cellular solids for smart structures by powder particle assembling

Satoshi Kishimoto, Norio Shinya

Proceedings Volume 3324, (1998) https://doi.org/10.1117/12.316871

KEYWORDS: Solids, Particles, Signal attenuation, Temperature metrology, Ultrasonics, Absorption, Smart structures, Scanning electron microscopy, Foam, Metals

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SPIE Journal Paper | 1 August 1997

New method for the measurement of surface variations using a microdevice and a scanning electron microscope

Satoshi Kishimoto, George Johnson

OE, Vol. 36, Issue 08, (August 1997) https://doi.org/10.1117/12.10.1117/1.601459

KEYWORDS: Scanning electron microscopy, Sensors, Electron microscopes, Electron beams, Computing systems, Micromachining, Optical engineering, Contamination, Image processing, Distance measurement

Proceedings Article | 19 September 1995 Paper

In-situ process monitoring in metal deposition processes

Shigeru Kobayashi, Eisuke Nishitani, Hideaki Shimamura, Akira Yajima, Satoshi Kishimoto, Yuji Yoneoka, Hiroyuki Uchida, Natsuyo Morioka

Proceedings Volume 2637, (1995) https://doi.org/10.1117/12.221303

KEYWORDS: Semiconducting wafers, Metals, Deposition processes, Sputter deposition, Temperature metrology, Chemical vapor deposition, Argon, Ionization, Aluminum, Stray light

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SPIE Journal Paper | 1 March 1993

Microcreep deformation measurements by a moiré method using electron beam lithography and electron beam scan

Satoshi Kishimoto, Mitsuru Egashira, Norio Shinya

OE, Vol. 32, Issue 03, (March 1993) https://doi.org/10.1117/12.10.1117/12.61046

KEYWORDS: Moire patterns, Scanning electron microscopy, Electron beams, Copper, Fringe analysis, Electron beam lithography, Metals, Electron microscopes, Process modeling, Gold

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Proceedings Article | 1 December 1991 Paper

Development of electron moire method using a scanning electron microscope

Satoshi Kishimoto, Mitsuru Egashira, Norio Shinya

Proceedings Volume 1554, (1991) https://doi.org/10.1117/12.57487

KEYWORDS: Moire patterns, Scanning electron microscopy, Electron beams, Copper, Fringe analysis, Metals, Holographic interferometry, Mechanics, Fourier transforms, Electron microscopes

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Showing 5 of 15 publications

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