Dr. Shujie Liu
Associate Professor at Dalian University of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 December 2005 Paper
Proceedings Volume 6049, 604903 (2005) https://doi.org/10.1117/12.647962
KEYWORDS: Atomic force microscopy, Finite element methods, Thin films, Diamond, Interferometers, Chemical elements, Actuators, Semiconductors, Photoresist processing, Semiconductor materials

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top