Ms. Soheila Mardani Profile

Soheila Mardani

at Univ. Twente

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Author

Publications (4)

Proceedings Article | 13 March 2024 Presentation

Sputter-deposited aluminium oxide as a waveguide platform for UV photonics

Dawson Bonneville, Ward A. P. Hendriks, Soheila Mardani, Nadia Chahir, Bjorn Jongebloed, Meindert Dijkstra, Sonia García-Blanco

Proceedings Volume PC12889, PC1288905 (2024) https://doi.org/10.1117/12.3004840

KEYWORDS: Ultraviolet radiation, Waveguides, Quantum photonics, Aluminum oxide, Integrated photonics, Atomic layer deposition, Visible radiation, Thin films, Electron beam lithography, Dry etching

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Proceedings Article | 7 April 2023 Presentation

First near-UV hybrid integrated laser in the Al2O3 platform

Cornelis Franken, Ward Hendriks, Meindert Dijkstra, Adriano do Nascimento, Lisa Winkler, Albert van Rees, Soheila Mardani, Ronald Dekker, Joost van Kerkhof, Peter van der Slot, Sonia García-Blanco, Klaus Boller

Proceedings Volume PC12424, PC124240A (2023) https://doi.org/10.1117/12.2657253

KEYWORDS: Ultraviolet radiation, Semiconductor lasers, Photonic integrated circuits, Waveguides, Wave propagation, Silicon, Laser applications, Visible radiation, Tunable lasers, Transparency

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Proceedings Article | 17 March 2023 Presentation + Paper

Low-loss photonic integrated circuits for UV applications

W. A. P. Hendriks, M. Dijkstra, S. Mardani, I. Hegeman, Sonia Garcia-Blanco

Proceedings Volume 12424, 1242402 (2023) https://doi.org/10.1117/12.2657143

KEYWORDS: Waveguides, Ultraviolet radiation, Photonic integrated circuits, Aluminum, Light wave propagation, Wave propagation, Atomic layer deposition, Aluminum oxide, Refractive index, Cladding

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Proceedings Article | 17 March 2023 Presentation + Paper

Low-loss sputter coated aluminum nitride waveguides

S. Mardani, W. A. P. Hendriks, M. Dijkstra, S. Garcia-Blanco

Proceedings Volume 12424, 1242403 (2023) https://doi.org/10.1117/12.2656323

KEYWORDS: Annealing, Aluminum nitride, Wave propagation, Waveguides, Photonic integrated circuits, Sputter deposition, Surface roughness, Thin films, Ultraviolet radiation, Silicon

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