Stephen J. Buffat
Staff Research Scientist at Lockheed Martin
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 11 June 1999 Paper
Stephen Buffat, Bee Kickel, B. Philipps, J. Adams, Matthew Ross, Jason Minter, Trey Marlowe, Selmer Wong
Proceedings Volume 3678, (1999) https://doi.org/10.1117/12.350167
KEYWORDS: Semiconducting wafers, Photoresist materials, Electron beams, Deep ultraviolet, Ions, Photoresist processing, Scanning electron microscopy, Silicon, Oxides, Photomasks

Proceedings Article | 7 July 1997 Paper
Proceedings Volume 3051, (1997) https://doi.org/10.1117/12.276029
KEYWORDS: Reflectivity, Metals, Photoresist materials, Aluminum, Resist chemistry, Optical lithography, Manufacturing, Interfaces, Absorption, Wafer manufacturing

Conference Committee Involvement (1)
Data Analysis and Modeling for Patterning Control III
23 February 2006 | San Jose, California, United States
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