X-ray computed tomography (XCT) is uniquely suitable for non-destructive dimensional measurements of delicate or internal features produced, for example, by additive manufacturing. While XCT has long been used in medical imaging, it has been used for industrial dimensional measurements only in recent years. The error sources in XCT of industrial components is still a topic of active research. One subgroup of potential error sources in XCT measurements are uncorrected XCT instrument geometry errors, such as detector misalignment or rotation stage errors, and are the focus of this paper. We demonstrate the effect of some instrument geometry errors on measurements performed on a calibrated artifact and compare the results to those obtained through simulations. The overall objective of this work is to support ongoing efforts to develop documentary national and international standards for performance evaluations of XCT instruments. In this study, we focus on cone-beam XCT instruments.
This paper discusses the concept of metrological traceability to the International System of Units (SI) unit of length, the
meter. We describe how metrological traceability is realized, give a recent example of the standardization of laser
trackers, and discuss progress and challenges to the traceability of 3D imaging data.
This paper reports to the international community on recent developments in technical policies, programs, and capabilities at the U.S. (United States) National Institute of Standards and Technology (NIST) related to traceability in dimensional measurements. These developments include: formal NIST policies on traceability and assuring quality in the results of the measurements it delivers to customers in calibration and measurement certificates, and a program to support the achievement of traceability to the SI (International System of Units) unit of length in dimensional measurements by manufacturers without direct recourse to a National Metrology Institute (NMI) for dimensional calibrations.
Conference Committee Involvement (2)
3D Imaging Metrology
24 January 2011 | San Francisco Airport, California, United States
3D Imaging Metrology
19 January 2009 | San Jose, California, United States
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