Mr. Thibault Seure Profile

Thibault Seure

R&D Optical Engineer at Eulitha AG

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Author

Publications (5)

Proceedings Article | 10 April 2024 Presentation

300mm+ substrate UV/DUV low-cost, reliable periodic patterning solution for high-volume manufacturing

Kelsey Wooley, Harun Solak, Christian Dais, Francis Clube, Ahmed Mohammad, Iuliia Bykova, Thibault Seure, Mehdi Heydari, Matthew Wilson, Li Wang

Proceedings Volume PC12956, PC129560O (2024) https://doi.org/10.1117/12.3013328

KEYWORDS: Optical lithography, Semiconducting wafers, Photomasks, Lithography, High volume manufacturing, Photonics, Ultraviolet radiation, Standards development, Projection lithography, Deep ultraviolet

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Proceedings Article | 12 July 2019 Open Access

X-ray testing at PANTER of optics for the ATHENA and Arcus Missions

Vadim Burwitz, Marcos Bavdaz, Eric Wille, Max Collon, Giuseppe Vacanti, Nicolas Barriere, Giuseppe Valsecchi, Fabio Marioni, Dervis Vernani, Thibault Seure, Steffen Blum, Richard Willingale, Randall Smith, Casey de Roo, Ed Hertz, Gisela Hartner, Marlis-Madeleine La Caria, Carlo Pelliciari, Andreas Langmeier, Stefan Felix Hartl

Proceedings Volume 11180, 1118024 (2019) https://doi.org/10.1117/12.2535995

KEYWORDS: X-ray optics, Mirrors, X-rays, Point spread functions, Optical alignment, Optical fabrication, Sensors, Silicon, X-ray detectors, Optical testing

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Proceedings Article | 6 July 2018 Paper

Integration of the ATHENA mirror modules: development status of the indirect and direct x-ray methods

Dervis Vernani, Steffen Blum, Thibault Seure, Marcos Bavdaz, Eric Wille, Nicolas Barriere, Maximilien Collon, Giuseppe Vacanti, Levent Cibik, Michael Krumrey, Peter Mueller, Vadim Burwitz

Proceedings Volume 10699, 1069910 (2018) https://doi.org/10.1117/12.2312583

KEYWORDS: X-rays, Mirrors, Optical alignment, Mirror structures, Interfaces, Sensors, X-ray optics, Point spread functions, Metrology, Lab on a chip

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Proceedings Article | 29 August 2017 Presentation + Paper

Integration of the ATHENA mirror modules: development of indirect and x-ray direct AIT methods

Dervis Vernani, Steffen Blum, Thibault Seure, Marcos Bavdaz, Eric Wille, Uwe Schaeffer, Nicolas Lièvre, Adeeb Nazeeruddin, Nicolas Barrière, Maximilien Collon, Levent Cibik, Michael Krumrey, Peter Müller, Vadim Burwitz

Proceedings Volume 10399, 103990F (2017) https://doi.org/10.1117/12.2273829

KEYWORDS: X-rays, Mirrors, Mirror structures, Optical alignment, Metrology, Titanium, Interfaces, Aluminum, X-ray optics, Manufacturing

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Proceedings Article | 18 December 2012 Paper

Ultra stable off-axis telescope: lessons learnt from the optical design to the correlation of the test results

Antonio Casciello, Thomas Weigel, Matthias Raunhardt, Andreas Herren, Steffen Blum, Nicolas de Roux, Thibault Seure, Ulrich Krähenbühl, Martin Herbert

Proceedings Volume 8550, 855017 (2012) https://doi.org/10.1117/12.981201

KEYWORDS: Space telescopes, Telescopes, Temperature metrology, Mirrors, Space mirrors, Absorption, Thermography, Manufacturing, Optical design, Interfaces

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