Tobais Würschmidt
at HÜBNER GmbH & Co KG
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 October 2013 Paper
Proceedings Volume 8900, 89000M (2013) https://doi.org/10.1117/12.2029172
KEYWORDS: Extremely high frequency, X-rays, Scanners, Imaging systems, Inspection, Terahertz radiation, Antennas, Dielectrics, Explosives, Spectroscopy

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