Tran Nam Nguyen
PhD Research Student
SPIE Involvement:
Author
Area of Expertise:
optical metrology techniques , computer vision , digital image processing , numerical stress/strain analysis , experimental solid mechanics
Websites:
Publications (1)

SPIE Journal Paper | 1 October 2011
Tran Nam Nguyen, Jonathan Huntley, Richard Burguete, C. Russell Coggrave
OE, Vol. 50, Issue 10, 101505, (October 2011) https://doi.org/10.1117/12.10.1117/1.3572190
KEYWORDS: Digital image correlation, 3D image processing, Cameras, 3D metrology, Error analysis, Clouds, Statistical analysis, Projection systems, Speckle pattern, Optical engineering

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