Mr. Tuomas Vainikka Profile

Tuomas Vainikka

at Univ of Helsinki

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 21 June 2019 Presentation + Paper

Label-free 3D super-resolution nanoscope

I. Kassamakov, G. Maconi, M. Järvinen, A. Nolvi, T. Vainikka, P. Raatikainen, T. Arstila, T. Ylitalo, I. Ninca, K. Ahlers, E. Hæggström

Proceedings Volume 11056, 110560S (2019) https://doi.org/10.1117/12.2526111

KEYWORDS: Super resolution, Optical spheres, Objectives, Monte Carlo methods, Diffraction, Interferometry, Polymers, Glasses, Semiconducting wafers, 3D modeling

Read Abstract +

Proceedings Article | 21 June 2019 Presentation + Paper

Light-sample interaction in microsphere enhanced 2D super-resolution imaging

Göran Maconi, Ivan Kassamakov, T. Vainikka, Timo Arstila, Edward Hæggström

Proceedings Volume 11056, 110560Q (2019) https://doi.org/10.1117/12.2525489

KEYWORDS: Monte Carlo methods, Super resolution, Finite-difference time-domain method, Optical spheres, Diffraction, Objectives, Device simulation, Microscopes, Light scattering, Near field

Read Abstract +

Proceedings Article | 7 November 2018 Paper

3D label free bio-transfer standards

Miikka Järvinen, Tuomas Vainikka , Tapani Viitala, Carlos Bermudez, Roger Artigas, Anton Nolvi, Pol Martinez, Niklas Sandler, Edward Hæggström, Ivan Kassamakov

Proceedings Volume 10819, 108190D (2018) https://doi.org/10.1117/12.2501258

KEYWORDS: Calibration, Standards development, 3D metrology, Solids, 3D image processing, Neodymium, Time metrology, Mirrors, 3D imaging standards, Metrology

Read Abstract +

Proceedings Article | 16 October 2017 Paper

Direct laser writing: virtual mask optimization for optical quality control artefact

Miikka Järvinen, Gianmario Scotti, Tuomas Vainikka, Edward Hæggström, Ivan Kassamakov

Proceedings Volume 10451, 104511Q (2017) https://doi.org/10.1117/12.2280547

KEYWORDS: Photoresist materials, Photomasks, Diffractive optical elements, Multiphoton lithography, Microscopes, MATLAB, Source mask optimization, Modulation, 3D metrology, Semiconducting wafers

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years