Dr. Vadim Sidorkin
Lead Nanofabrication Engineer at Microsoft Corporation
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 26 March 2019 Presentation + Paper
Proceedings Volume 10957, 109570K (2019) https://doi.org/10.1117/12.2513666
KEYWORDS: Extreme ultraviolet, Photomasks, Metrology, Electron beam lithography, Reticles

Proceedings Article | 8 October 2014 Paper
Vadim Sidorkin, Michael Finken, Timo Wandel, Noriaki Nakayamada, G. Cantrell
Proceedings Volume 9235, 92350Z (2014) https://doi.org/10.1117/12.2066126
KEYWORDS: Photomasks, Metals, Calibration, Reticles, Electron beam lithography, Overlay metrology, Performance modeling, Data modeling, Instrument modeling, Visualization

Proceedings Article | 2 April 2010 Paper
Diederik Maas, Emile van Veldhoven, Ping Chen, Vadim Sidorkin, Huub Salemink, Emile van der Drift, Paul Alkemade
Proceedings Volume 7638, 763814 (2010) https://doi.org/10.1117/12.862438
KEYWORDS: Helium, Ions, Nanofabrication, Ion beams, Scanning helium ion microscopy, Electron beam lithography, Ion beam lithography, Polymers, Inspection, Nanolithography

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