Dr. Wai Yip Kwok
Applications Engineer at Synopsys, Inc.
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 23 August 2021 Paper
Wai Yip Kwok, Johnny Yeap, Sebastian Munoz, Seurien Chou, Tokiharu Sekiya, Hari Konnanur
Proceedings Volume 11908, 1190806 (2021) https://doi.org/10.1117/12.2601035

Proceedings Article | 25 September 2010 Paper
Proceedings Volume 7823, 78230B (2010) https://doi.org/10.1117/12.868037
KEYWORDS: Laser phosphor displays, Etching, Backscatter, SRAF, Electron beams, Line edge roughness, Photomasks, Manufacturing, Inspection, Image quality

Proceedings Article | 7 March 2008 Paper
Wen-Hao Cheng, Jeff Farnsworth, Wai Kwok, Andrew Jamieson, Nathan Wilcox, Matt Vernon, Karmen Yung, Yi-Ping Liu, Jun Kim, Eric Frendberg, Scott Chegwidden, Richard Schenker, Yan Borodovsky
Proceedings Volume 6924, 69241G (2008) https://doi.org/10.1117/12.772955
KEYWORDS: Photomasks, Optical lithography, Glasses, Image resolution, Chromium, Etching, 3D modeling, Electron beam lithography, Defect inspection, Semiconducting wafers

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