Dr. Wende Liu
at National Institute of Metrology
SPIE Involvement:
Author
Area of Expertise:
optical metrology , ellipsometry , radiometry
Publications (23)

Proceedings Article | 27 November 2024 Paper
Proceedings Volume 13237, 1323708 (2024) https://doi.org/10.1117/12.3036037
KEYWORDS: Projection systems, Cameras, Machine vision, Calibration, Inspection, Curtains, Tunable filters, Superposition, Optical filters, Imaging systems

Proceedings Article | 20 November 2024 Poster + Paper
Yikang Gong, Wende Liu, Haiyong Gan, Yuanrui Dong, Zhe Peng, Zuo Chen
Proceedings Volume 13241, 1324119 (2024) https://doi.org/10.1117/12.3036430
KEYWORDS: Cameras, Imaging systems, Machine vision, Light sources and illumination, Digital cameras, Image resolution, Spatial resolution, Signal to noise ratio

Proceedings Article | 30 April 2024 Paper
Proceedings Volume 13156, 131561I (2024) https://doi.org/10.1117/12.3019867
KEYWORDS: Solar cells, Computer simulations, Object detection, Electroluminescence, Defect detection

Proceedings Article | 30 April 2024 Paper
Proceedings Volume 13153, 131531K (2024) https://doi.org/10.1117/12.3020162
KEYWORDS: Sensors, Imaging systems, Image sensors, Cameras, Measurement uncertainty

Proceedings Article | 30 April 2024 Paper
Qi Zang, Shaozhe Cui, Weijie Wang, Tao Liang, Xiaolu Zhan, Wende Liu, Yingwei He, Zhengang Lu, Haiyong Gan
Proceedings Volume 13153, 1315318 (2024) https://doi.org/10.1117/12.3018684
KEYWORDS: Laser scanners, Galvanometers, Calibration, Mirrors, Beam controllers, Servomechanisms, Light sources and illumination, Laser frequency, Beam steering, Scanners

Showing 5 of 23 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top