Yan Li
at Changcheng Institute of Metrology & Measurement
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 8 July 2022 Paper
Proceedings Volume 12282, 1228218 (2022) https://doi.org/10.1117/12.2616427
KEYWORDS: Measurement devices, Composites, Calibration, Control systems, Data storage, Switching, Manufacturing, Patents, Optical testing, Metrology

Proceedings Article | 12 March 2020 Paper
Yan Li, Hongru Li, Xiaochuan Gan, Jiansu Qu, Xiaosu Ma
Proceedings Volume 11439, 114390S (2020) https://doi.org/10.1117/12.2543291
KEYWORDS: Image processing, Light sources, Calibration, CCD cameras, Image segmentation, Photogrammetry

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