Dr. Yi Jin
at Univ of Science and Technology of China
SPIE Involvement:
Author
Publications (31)

Proceedings Article | 4 April 2023 Paper
Proceedings Volume 12617, 1261746 (2023) https://doi.org/10.1117/12.2666253
KEYWORDS: Modulation, Fringe analysis, Network security, 3D metrology, Phase distribution, Phase shift keying, Error analysis, Sensors, Network architectures, Education and training

Proceedings Article | 29 March 2022 Paper
Proceedings Volume 12169, 12169CL (2022) https://doi.org/10.1117/12.2627317
KEYWORDS: Cameras, 3D metrology, Mirrors, Projection systems, Fringe analysis, Imaging systems, Clouds, Calibration, Image registration, Sun

Proceedings Article | 27 March 2022 Paper
Proceedings Volume 12169, 12169BX (2022) https://doi.org/10.1117/12.2627070
KEYWORDS: Fringe analysis, Phase retrieval, Image segmentation, Projection systems, Reliability, Image resolution, Cameras, 3D metrology

Proceedings Article | 27 March 2022 Paper
Proceedings Volume 12169, 12169B9 (2022) https://doi.org/10.1117/12.2626748
KEYWORDS: 3D metrology, Imaging systems, Cameras, Projection systems, 3D acquisition, Fringe analysis, Phase shift keying, Reliability

Proceedings Article | 15 February 2022 Paper
Proceedings Volume 12166, 121667U (2022) https://doi.org/10.1117/12.2618015
KEYWORDS: Binary data, Fringe analysis, Modulation, 3D metrology, Phase shifts, Phase shift keying, 3D image processing, Projection systems, Composites

Showing 5 of 31 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top