Dr. Yi Liao Profile

Dr. Yi Liao

Lead Research Engineer at GE Global Research

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 19 May 2015 Paper

Geometric and topological feature extraction of linear segments from 2D cross-section data of 3D point clouds

Rajesh Ramamurthy, Kevin Harding, Xiaoming Du, Vincent Lucas, Yi Liao, Ratnadeep Paul, Tao Jia

Proceedings Volume 9489, 948905 (2015) https://doi.org/10.1117/12.2179987

KEYWORDS: Clouds, Feature extraction, 3D metrology, Sensors, Inspection, Computer aided design, Tolerancing, Optical sensors, 3D modeling, Optical testing

Read Abstract +

Proceedings Article | 14 May 2015 Paper

Small hole inner profile measurement methods

Yi Liao, Kevin Harding, Rajesh Ramamurthy

Proceedings Volume 9489, 94890M (2015) https://doi.org/10.1117/12.2177362

KEYWORDS: Confocal microscopy, Computed tomography, Sensors, Imaging systems, Microscopes, Associative arrays, Microscopy, Phase shifting, Manufacturing, Structured light

Read Abstract +

Proceedings Article | 28 May 2014 Paper

Error correction for Moiré based creep measurement system

Yi Liao, Kevin Harding, Edward Nieters, Robert Tait, Wayne Hasz, Nicole Piche

Proceedings Volume 9110, 911007 (2014) https://doi.org/10.1117/12.2050595

KEYWORDS: Imaging systems, Cameras, Calibration, Eye, Error analysis, Manufacturing, Moire patterns, Prototyping, Optical design, Ronchi rulings

Read Abstract +

Proceedings Article | 20 November 2012 Paper

Continuous turbine blade creep measurement based on Moiré

Yi Liao, Robert Tait, Kevin Harding, Edward Nieters, Wayne Hasz, Nicole Piche

Proceedings Volume 8563, 85630H (2012) https://doi.org/10.1117/12.2000283

KEYWORDS: Image enhancement, Cameras, Modulation transfer functions, Interference (communication), Imaging systems, Factor analysis, Monochromatic aberrations, Prototyping, Software development, Light sources and illumination

Read Abstract +

Proceedings Article | 14 September 2011 Paper

Automated 3D IR defect mapping system for CZT wafer and tile inspection and characterization

Yi Liao, Esmaeil Heidari, Gil Abramovich, Christopher Nafis, Amer Butt, Joseph Czechowski, Kevin Harding, J. Eric Tkaczyk

Proceedings Volume 8133, 81330P (2011) https://doi.org/10.1117/12.892765

KEYWORDS: Semiconducting wafers, Infrared imaging, Inspection, Sensors, Associative arrays, Wafer inspection, 3D image processing, Neodymium, Crystals, Ions

Read Abstract +

Proceedings Article | 8 September 2010 Paper

Defect detection and classification of machined surfaces under multiple illuminant directions

Yi Liao, Xin Weng, C. Swonger, Jun Ni

Proceedings Volume 7798, 77981T (2010) https://doi.org/10.1117/12.860867

KEYWORDS: Image segmentation, Inspection, Defect detection, Light emitting diodes, Image processing, Head, Image classification, Machine vision, Defect inspection, Algorithm development

Read Abstract +

Showing 5 of 6 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years