Dr. Yoshihiro Taguchi
at Keio Univ
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 15 March 2016 Paper
Makoto Kamata, Kan Yamada, Yoshihiro Taguchi, Yuji Nagasaka
Proceedings Volume 9760, 97600P (2016) https://doi.org/10.1117/12.2216748
KEYWORDS: Diffusion, Dielectrophoresis, Sensors, Amorphous silicon, Sputter deposition, Point-of-care devices, Microelectromechanical systems, Optical manipulation, Proteins, Optical tweezers, Electrodes, Light, Plasma enhanced chemical vapor deposition, Laser development

Proceedings Article | 18 February 2010 Paper
K. Itani, A. Ebisui, Y. Taguchi, Y. Nagasaka
Proceedings Volume 7593, 759306 (2010) https://doi.org/10.1117/12.841737
KEYWORDS: Diffusion, Dielectrophoresis, Particles, Electrodes, Prototyping, Sensors, Glasses, Microelectromechanical systems, Electronic test equipment, Proteins

Proceedings Article | 17 February 2010 Paper
H. Abe, R. Nagamachi, Y. Taguchi, Y. Nagasaka
Proceedings Volume 7594, 75940L (2010) https://doi.org/10.1117/12.841739
KEYWORDS: Sensors, Liquids, Optical tracking, Optical fibers, Signal detection, Capillaries, Control systems, Signal processing, Silicon, Integrated optics

Proceedings Article | 8 February 2008 Paper
A. Ebisui, Y. Taguchi, Y. Nagasaka
Proceedings Volume 6887, 68870G (2008) https://doi.org/10.1117/12.759637
KEYWORDS: Signal detection, Capillaries, Sensors, Liquids, Laser development, Semiconducting wafers, Deep reactive ion etching, Aluminum, Detection theory, Silica

Proceedings Article | 22 January 2007 Paper
Proceedings Volume 6466, 64660G (2007) https://doi.org/10.1117/12.711560
KEYWORDS: Microelectromechanical systems, Scanners, Mirrors, Luminescence, Reflectivity, Confocal microscopy, Microscopes, Silicon, Semiconducting wafers, Aluminum

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