Dr. Yunjian Bai Profile

Dr. Yunjian Bai

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 3 June 2024 Paper

Calibration of the reflectivity-related error of the indirect time-of-flight imaging systems

Yi Luo, Ping Song, Yunjian Bai

Proceedings Volume 13182, 131820U (2024) https://doi.org/10.1117/12.3030643

KEYWORDS: Reflectivity, Distance measurement, Calibration, Error analysis, Imaging systems, Reflection, Signal intensity, Time of flight imaging, Modulation, Phase measurement

Read Abstract +

The indirect time-of-flight imaging system possesses the characteristics of high real-time, high integration, and low cost, so it has a wide range of applications. However, the different reflectivity of the measured object will affect the change of the received signal, resulting in different degrees of depth error in the system. In this paper, we analyze the influence of reflectivity on the system, establish the reflectivity-related error model, and propose the error calibration method. The proposed method estimates the approximate reflectivity of the measured object through the range and amplitude information output by the system at first, Then the parameters of the error curve model are changed according to the obtained reflectivity, and the corresponding compensation is obtained. This method can select the corresponding compensation amount for objects with different reflectivity. The experimental verification shows that the method in this paper has a good effect on the calibration of reflectivity-related errors.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years