Dr. Yuxiang Wu Profile

KEYWORDS: Diffusers, Cameras, Calibration, 3D modeling, Data modeling, Light scattering, Scattering, Scattering media, 3D acquisition, 3D image processing

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Proceedings Article | 10 January 2018 Paper

Fringe projection profilometry with portable consumer devices

Danji Liu, Zhipeng Pan, Yuxiang Wu, Huimin Yue

Proceedings Volume 10616, 1061617 (2018) https://doi.org/10.1117/12.2295088

KEYWORDS: Cameras, Imaging systems, Calibration, Projection systems, Fringe analysis, 3D metrology, Complex systems, Phase shifting, Optoelectronic devices, CCD cameras

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Proceedings Article | 26 June 2017 Paper

Accurate characterisation of hole geometries by fringe projection profilometry

Yuxiang Wu, Harshana Dantanarayana, Huimin Yue, Jonathan Huntley

Proceedings Volume 10332, 1033204 (2017) https://doi.org/10.1117/12.2270210

KEYWORDS: Error analysis, Scanners, Point spread functions, Phase measurement, Edge detection, Cameras, Fringe analysis, 3D scanning, 3D metrology

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SPIE Journal Paper | 29 June 2016

Flexible global calibration technique for an arbitrarily arranged fringe projection profilometry system

Huimin Yue, Biyu Zhao, Yuxiang Wu, Mingyang Li

OE, Vol. 55, Issue 06, 064113, (June 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.6.064113

KEYWORDS: Calibration, Cameras, Imaging systems, Projection systems, Distortion, Optical engineering, Fringe analysis, Zirconium, Lithium, Mathematical modeling

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SPIE Journal Paper | 26 February 2016

Dynamic specular surface measurement based on color-encoded fringe reflection technique

Yuxiang Wu, Huimin Yue, Jingya Yi, Mingyang Li, Yong Liu

OE, Vol. 55, Issue 02, 024104, (February 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.2.024104

KEYWORDS: Fringe analysis, Reflection, Mirrors, Composites, Reflectometry, Semiconducting wafers, CCD cameras, Modulation, LCDs, Optical engineering

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SPIE Journal Paper | 23 June 2015

Phase error analysis and reduction in phase measuring deflectometry

Yuxiang Wu, Huimin Yue, Jingya Yi, Mingyang Li, Yong Liu

OE, Vol. 54, Issue 06, 064103, (June 2015) https://doi.org/10.1117/12.10.1117/1.OE.54.6.064103

KEYWORDS: Fringe analysis, Error analysis, Deflectometry, CCD cameras, Phase shifts, Phase shift keying, Cameras, LCDs, Composites, Spatial frequencies

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SPIE Journal Paper | 7 April 2015

Simultaneous and signal-to-noise ratio enhancement extraction of vibration location and frequency information in phase-sensitive optical time domain reflectometry distributed sensing system

Huimin Yue, Bo Zhang, Yuxiang Wu, Biyu Zhao, Jianfeng Li, Zhonghua Ou, Yong Liu

OE, Vol. 54, Issue 04, 047101, (April 2015) https://doi.org/10.1117/12.10.1117/1.OE.54.4.047101

KEYWORDS: Signal to noise ratio, Backscatter, Fourier transforms, Spatial resolution, Sensing systems, Reflectometry, Signal processing, Ferroelectric materials, Data acquisition, Interference (communication)

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Proceedings Article | 13 November 2014 Paper

Single-shot three-dimensional shape measurement of specular surfaces by orthogonal color fringe pattern reflection technique

Yuxiang Wu, Huimin Yue, Jingya Yi, Mingyang Li, Yong Liu

Proceedings Volume 9276, 927603 (2014) https://doi.org/10.1117/12.2072410

KEYWORDS: Fringe analysis, CCD cameras, Semiconducting wafers, Reflectometry, Reflection, Composites, LCDs, MATLAB, Fourier transforms, Mirrors

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Proceedings Article | 18 September 2014 Paper

High-accuracy inspection of defects and profile of wafers by phase measuring deflectometry

Huimin Yue, Yuxiang Wu, Biyu Zhao, Zhonghua Ou, Yong Liu

Proceedings Volume 9282, 928208 (2014) https://doi.org/10.1117/12.2067887

KEYWORDS: Semiconducting wafers, Inspection, Wafer inspection, Defect inspection, Deflectometry, Spatial resolution, Fringe analysis, Phase shift keying, Photovoltaics, Defect detection

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Proceedings Article | 18 September 2014 Paper

Accuracy enhancement of three-dimensional surface shape measurement using curvelet transform

Biyu Zhao, Huimin Yue, Yuxiang Wu, Zhonghua Ou, Yong Liu

Proceedings Volume 9282, 92820D (2014) https://doi.org/10.1117/12.2068418

KEYWORDS: Denoising, Wavelet transforms, Fringe analysis, 3D image processing, Fourier transforms, 3D metrology, Image processing, Image analysis, Image denoising, Projection systems

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Showing 5 of 13 publications

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