David H. Parker
President at Parker Intellectual Property Enterprises, LLC
SPIE Involvement:
Author
Area of Expertise:
Electrical Engineering , Physics , Intellectual Property
Profile Summary

Background in Electrical Engineering, Physics, Metrology, Research & Development, and Intellectual Property. Presently working in Intellectual Property as an Inventor and Patent Agent.
Publications (5)

Proceedings Article | 24 August 2017 Presentation + Paper
Proceedings Volume 10376, 1037609 (2017) https://doi.org/10.1117/12.2274277
KEYWORDS: Modulation, Wavefronts, Amplitude modulation, Optical components, Optical tracking, Interferometers, Retroreflectors, Ray tracing, Phase measurement, Heterodyning

Proceedings Article | 19 April 2017 Presentation + Paper
Proceedings Volume 10169, 1016918 (2017) https://doi.org/10.1117/12.2260254
KEYWORDS: Nondestructive evaluation, 3D metrology, Distance measurement, 3D acquisition, Retroreflectors, Buildings, Structural health monitoring, Patents, Finite element methods, Bridges, Interferometers, Manufacturing

SPIE Journal Paper | 1 July 2006
David Parker, Michael Goldman, Bill Radcliff, John Shelton
OE, Vol. 45, Issue 07, 073605, (July 2006) https://doi.org/10.1117/12.10.1117/1.2227013
KEYWORDS: Retroreflectors, Distance measurement, Signal attenuation, Reflection, Glasses, Sensors, Phase shifts, Mirrors, Calibration, Solids

Proceedings Article | 31 July 1998 Paper
Robert Hall, Michael Goldman, David Parker, John Payne
Proceedings Volume 3357, (1998) https://doi.org/10.1117/12.317361
KEYWORDS: Telescopes, Servomechanisms, Metrology, Finite element methods, Antennas, Reflectors, Laser systems engineering, Laser metrology, Error analysis, Astronomy

SPIE Journal Paper | 1 October 1991
OE, Vol. 30, Issue 10, (October 1991) https://doi.org/10.1117/12.10.1117/12.55958
KEYWORDS: Moire patterns, Spatial filters, Optical filters, Fourier transforms, Spatial frequencies, Solid state cameras, Image processing, Phase shifting, Visualization, Algorithm development

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