1 April 2000 Phase-shifting interferometry: minimization of systematic errors
Parameswaran Hariharan
Author Affiliations +
Phase-shifting interferometry is now used widely to map the deviations of optical surfaces from a reference plane or reference sphere. However, the accuracy of such measurements is limited by systematic errors due to several causes. These systematic errors can be minimized by a simple averaging technique.
Parameswaran Hariharan "Phase-shifting interferometry: minimization of systematic errors," Optical Engineering 39(4), (1 April 2000). https://doi.org/10.1117/1.602443
Published: 1 April 2000
Lens.org Logo
CITATIONS
Cited by 49 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Phase interferometry

Algorithm development

Phase shifts

Ferroelectric materials

Error analysis

Interferometers

Optical testing

Back to Top