Optoelectronic hidden grids and moire patterns: basics and applications in distance measurement

Mario Garavaglia; Anibal P. Laquidara

doi:10.1117/1.1403452

1 November 2001 Optoelectronic hidden grids and moire patterns: basics and applications in distance measurement

Mario Garavaglia, Anibal P. Laquidara

Optical Engineering, Vol. 40, Issue 11, (November 2001). https://doi.org/10.1117/1.1403452

Moire fringes are visually observed when two 2-D implicit grids are superposed and rotated. We introduce two innovations in the broad field of moiré. The first calls attention to hidden or implicit grids from the photocopying process that are also used to produce moire patterns. This method of moire pattern production is extended to hidden grids optoelectronically generated by digitizing TV-CCD images. Our second innovation is a proposed application of this type of moire pattern to measure distances.

©(2001) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Mario Garavaglia and Anibal P. Laquidara "Optoelectronic hidden grids and moire patterns: basics and applications in distance measurement," Optical Engineering 40(11), (1 November 2001). https://doi.org/10.1117/1.1403452

Published: 1 November 2001

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