Paper
17 September 1997 Two methods for achieving subpixel resolution in phase difference determination by fringe pattern matching
Author Affiliations +
Proceedings Volume 3098, Optical Inspection and Micromeasurements II; (1997) https://doi.org/10.1117/12.281168
Event: Lasers and Optics in Manufacturing III, 1997, Munich, Germany
Abstract
This paper presents the methods of linear interpolation and polynomial curve fitting for achieving sub-pixel resolution phase difference determination by fringe pattern matching. These two methods wee examined by computer simulation and experiment. In computer simulation, the effects of the resolutions of imaging system were also discussed. The computer simulation and experimental result have shown that the method of linear interpolation and that of polynomial curve fitting can both be used to achieve sub-pixel resolution in the measurement of phase difference by fringe pattern matching. The phase difference between fringe patterns is easy to achieve by linear interpolation compared with polynomial curve fitting.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zuobin Wang, Peter John Bryanston-Cross, and Duc-Truong Pham "Two methods for achieving subpixel resolution in phase difference determination by fringe pattern matching", Proc. SPIE 3098, Optical Inspection and Micromeasurements II, (17 September 1997); https://doi.org/10.1117/12.281168
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KEYWORDS
Fringe analysis

Phase measurement

Computer simulations

Image resolution

Phase shifts

Spatial resolution

Imaging systems

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