Second-order susceptibility measurement of thin films by reflective second harmonic generation method: toward measurement standards in nonlinear optics

Costel Flueraru; Chander Prakash Grover

doi:10.1117/12.567494

20 December 2004 Second-order susceptibility measurement of thin films by reflective second harmonic generation method: toward measurement standards in nonlinear optics

Costel Flueraru, Chander Prakash Grover

Author Affiliations +

Proceedings Volume 5577, Photonics North 2004: Optical Components and Devices; (2004) https://doi.org/10.1117/12.567494
Event: Photonics North, 2004, Ottawa, Ontario, Canada

Abstract

There is a strong need for a simple and reliable characterization technique of nonlinear optical effects applicable to thin films. The second-order susceptibility is the parameter that plays a key role not only in SHG but also in cascading phenomena and optical bistabilities. The measurement methods of second-order susceptibility are divided into absolute and relative techniques. Relative measurements were performed to obtain the relative values of second-order susceptibility by comparison with a reference material, which is often crystalline quartz. There is a different approach for nonlinear optical characterization that depends on the type of sample: crystal or thin film. There are two methods used for second-order susceptibility measurement of thin films: a Maker fringe and reflective SHG. The Maker fringe is limited to the investigation of thin films on transparent substrates. Here we discuss an experimental protocol based on reflective SHG for nonlinear optical characterization of thin films. Since most measurements are performed relative to a reference material, the establishment of a well-accepted value for a standard material is important. The SHG in reflection of z-cut quartz is discussed in detail. The method is simple and reliable but limited to thin films. Measurements at different wavelengths and mapping will be reported.

Citation Download Citation

Costel Flueraru and Chander Prakash Grover "Second-order susceptibility measurement of thin films by reflective second harmonic generation method: toward measurement standards in nonlinear optics", Proc. SPIE 5577, Photonics North 2004: Optical Components and Devices, (20 December 2004); https://doi.org/10.1117/12.567494

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available