Prof. Benyong Chen
Director at Zhejiang Sci-Tech Univ
SPIE Involvement:
Conference Chair | Editor | Author
Publications (12)

SPIE Journal Paper | 23 April 2020
Liping Yan, Haoliang Feng, Benyong Chen, Xinyong Tang, Liu Huang
OE, Vol. 59, Issue 04, 046108, (April 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.4.046108
KEYWORDS: Spatial filters, Image segmentation, Speckle, Digital filtering, 3D metrology, Optical engineering, Optical filters, Beam splitters, Interferometry, Digital cameras

SPIE Journal Paper | 20 March 2018
Benyong Chen, Kaiyue Wu, Liping Yan, Jiandong Xie, Enzheng Zhang
OE, Vol. 57, Issue 03, 034106, (March 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.3.034106
KEYWORDS: Laser stabilization, Interferometers, Semiconductor lasers, Modulation, Oscillators, Beam splitters, Rubidium, Signal processing, Optical engineering, Laser sources

SPIE Journal Paper | 31 August 2016 Open Access
Liandong Yu, Peter Ott, Lianqing Zhu, Benyong Chen, Lianxiang Yang
OE, Vol. 55, Issue 09, 091399, (August 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.9.091399
KEYWORDS: Cameras, Silicon, Calibration, Vibrometry, Interferometers, Interferometry, Particles, Optical testing, Metrology, Packaging

SPIE Journal Paper | 2 March 2016
Liping Yan, Benyong Chen
OE, Vol. 55, Issue 09, 091401, (March 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.9.091401
KEYWORDS: Interferometers, Error analysis, Laser development, Nonlinear optics, Beam splitters, Wave propagation, Optical engineering, Signal detection, Laser metrology, Laser sources

Proceedings Article | 5 November 2015 Paper
Proceedings Volume 9795, 979514 (2015) https://doi.org/10.1117/12.2214428
KEYWORDS: Control systems, Control systems design, Signal generators, Data acquisition, Interferometers, LabVIEW, Ceramics, Metrology, Interfaces, Human-machine interfaces

Showing 5 of 12 publications
Proceedings Volume Editor (5)

SPIE Conference Volume | 22 December 2023

SPIE Conference Volume | 22 December 2022

SPIE Conference Volume | 10 November 2021

SPIE Conference Volume | 11 November 2020

SPIE Conference Volume | 3 January 2020

Conference Committee Involvement (6)
Optical Metrology and Inspection for Industrial Applications XI
12 October 2024 | Nantong, Jiangsu, China
Optical Metrology and Inspection for Industrial Applications X
15 October 2023 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IX
5 December 2022 | Online Only, China
Optical Metrology and Inspection for Industrial Applications VIII
11 October 2021 | Nantong, JS, China
Optical Metrology and Inspection for Industrial Applications VII
12 October 2020 | Online Only, China
Showing 5 of 6 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top