Dr. Bongkeun Kim
at SAMSUNG Electronics Co Ltd
SPIE Involvement:
Author
Publications (4)

SPIE Journal Paper | 26 May 2024
JM3, Vol. 23, Issue 02, 021303, (May 2024) https://doi.org/10.1117/12.10.1117/1.JMM.23.2.021303
KEYWORDS: Transformers, Visualization, Inspection, Design, Performance modeling, Image classification, Defect detection, Optical proximity correction, Education and training, Deep learning

Proceedings Article | 22 April 2024 Poster + Paper
Proceedings Volume 12957, 129571M (2024) https://doi.org/10.1117/12.3009845
KEYWORDS: Calibration, Optical proximity correction, Extreme ultraviolet, Data modeling, Education and training, Performance modeling, Advanced patterning, Metrology, Machine learning, Databases

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12955, 129551E (2024) https://doi.org/10.1117/12.3009806
KEYWORDS: Image classification, Semiconducting wafers, Feature extraction, Artificial intelligence, Machine learning, Visualization, Image processing, Image enhancement, Design, Advanced patterning

Proceedings Article | 21 November 2023 Presentation + Paper
Proceedings Volume 12751, 1275109 (2023) https://doi.org/10.1117/12.2685488
KEYWORDS: Transformers, Visualization, Design and modelling, Deep learning, Image classification, Data modeling

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