Dennis H. LeMieux
Engineer at Siemens Power Generation Inc
SPIE Involvement:
Conference Program Committee | Author
Publications (3)

Proceedings Article | 12 April 2007 Paper
Proceedings Volume 6541, 654103 (2007) https://doi.org/10.1117/12.722564
KEYWORDS: Error analysis, Temperature metrology, Reflectivity, Reflection, Sensors, Environmental sensing, Staring arrays, Signal attenuation, Roentgenium, Infrared radiation

Proceedings Article | 12 May 2005 Paper
Matthias Voigt, Martin Zarzycki, Dennis LeMieux, Visvanathan Ramesh
Proceedings Volume 5784, (2005) https://doi.org/10.1117/12.605766
KEYWORDS: Nonuniformity corrections, Sensors, Amplifiers, Statistical analysis, Systems modeling, Staring arrays, Error analysis, Neodymium, Image sensors, Motion models

Proceedings Article | 19 March 1999 Paper
Proceedings Volume 3700, (1999) https://doi.org/10.1117/12.342303
KEYWORDS: Thermography, Infrared radiation, Infrared imaging, Temperature metrology, Imaging systems, Safety, Black bodies, Video, Combustion, Radio propagation

Proceedings Volume Editor (2)

SPIE Conference Volume | 30 March 2000

SPIE Conference Volume | 19 March 1999

Conference Committee Involvement (24)
Thermosense: Thermal Infrared Applications XLVI
22 April 2024 | National Harbor, Maryland, United States
Thermosense: Thermal Infrared Applications XLV
2 May 2023 | Orlando, Florida, United States
Thermosense: Thermal Infrared Applications XLIV
5 April 2022 | Orlando, Florida, United States
Thermosense: Thermal Infrared Applications XLIII
12 April 2021 | Online Only, Florida, United States
Thermosense: Thermal Infrared Applications XLII
27 April 2020 | Online Only, California, United States
Showing 5 of 24 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top