Huimin Mu
at Missouri Univ of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 August 2003 Paper
Genda Chen, Huimin Mu, James Drewniak, David Pommerenke
Proceedings Volume 5057, (2003) https://doi.org/10.1117/12.482687
KEYWORDS: Sensors, Copper, Calibration, Prototyping, Inductance, Reflection, Numerical simulations, Reflectometry, Silicon, Adhesives

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